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- 2021 (2) (entfernen)
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- Englisch (2)
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- Additive manufacturing (1)
- Afterglow (1)
- Discharge arc (1)
- Flash lamp (1)
- Flash thermography (1)
- Laser powderbed fusion (1)
- Micro-CT (1)
- Pores (1)
- Pulse energy (1)
- Thermography (1)
Organisationseinheit der BAM
Active thermography is a fast, contactless and non-destructive technique that can be used to detect internal defects in different types of material. Volumetric irregularities such as the presence of pores in materials produced by the Additive Manufacturing processes can strongly affect the thermophysical and the mechanical properties of the final component.
In this work, an experimental investigation aimed at detecting different pores in a sample made of stainless AISI 316L produced by Laser Powder Bed Fusion (L-PBF) was carried out using pulsed thermography in reflection mode. The capability of the technique and the adopted setups in terms of geometrical and thermal resolution, acquisition frequency and energy Density of the heating source were assessed to discern two contiguous pores as well as to detect a single pore. Moreover, a quantitative indication about the minimum resolvable pore size among the available and analysed defects was provided. A powerful tool to assess the Limits and the opportunities of the pulsed technique in terms of detectability and localizability was provided by comparing active thermography results to Computed Tomography as well as a related Finite Element Analysis (FEA) to simulate the pulsed heating transfer with Comsol.
The knowledge about energy release and transient behaviour of flash lamps, used as short-term energy source in flash thermography investigations, is essential for a quantitative analysis of the results as well as for simulations regarding such experiments. Usually, only a rectangular pulse shape of a typical duration of a few milliseconds is regarded when flash lamps pulses are described. This note considers the afterglow period of a flash lamp explicitly and shows that negligence of this afterglow effect leads to a systematic underestimation of the pulse length and the related total energy release. In the reported case, the intensity transient recorded by a Silicon photo diode was transformed into a temperature transient, allowing the study of the real energy release. It turns out that approximately only 50% of the entire pulse energy were released during the usually regarded period of 2.8 ms, while the other half was released within a period of 20 ms with an exponential decay.