Filtern
Dokumenttyp
- Zeitschriftenartikel (3)
- Sonstiges (1)
Sprache
- Englisch (4) (entfernen)
Schlagworte
- Color X-ray camera (3)
- BAMline (1)
- BESSY (1)
- CXC (1)
- Dielektrische Analyse (1)
- Elektrische Eigenschaften (1)
- Gefüllte Kunststoffe (1)
- Polycapillary optics (1)
- Sub pixel analysis (1)
- Synchrotron radiation (1)
- Verbundwerkstoffe (1)
- Verlustfaktor (1)
- X-ray (1)
Investigations on the cold crystallization of pure and filled PETP by dielectric measurements
(1993)
The cold crystallization of pure and filled poly(ethylene terephthalate) (PETP) after quenching from the melt has been investigated by dielectric measurements in two different modes: The first one using constant heating-rate (in the temperature range from 320 to 480 K) and the second one under isothermal conditions (at 378 K). The complex dielectric constant (ε´, tan δ) is influenced by crystallization. Two α-relaxation regions are identified: The αa-relaxation region from the pure amorphous phase and the α´-relaxation region from the spherulitic phase. The investigations on the filled systems (PETP + 10% aramid puple, PETP + 30% short glass fibres) prove that an influence of the fillers on the time delay and rate of crystallization and on the geometry of the growing spherulites exists.
In a color X-ray camera spatial resolution is achieved by means of a polycapillary optic conducting X-ray photons from small regions on a sample to distinct energy dispersive pixels on a CCD matrix. At present, the resolution limit of color X-ray camera systems can go down to several microns and is mainly restricted by Pixel dimensions. The recent development of an efficient subpixel resolution algorithm allows a release from pixel size, limiting the resolution only to the quality of theoptics. In this work polycapillary properties that influence the spatial resolution are systematized and assessed both theoretically and experimentally. It is demonstrated that with the current technological Level reaching one micron resolution is challenging, but possible.
Examples of XRF and PIXE imaging with few microns resolution using SLcam® a color X-ray camera
(2015)
We present results of recent development of the color X-ray camera, type SLcam®, allowing detection of X-ray images with few microns resolution. Such spectral resolution is achieved with the use of high-quality polycapillary optics combined with sub-pixel resolution. Imaging of Siemens star resolution test chart reveals that the resolution limit of SLcam® can go down to nearly 5µm. Several real sample examples of measurements carried out at the laboratory, synchrotron, and particle-induced X-ray emission beamlines are shown. This is the first time SLcam® is used as particle-induced X-ray emission detector.
The color X-ray camera SLcam® is a full-field, single photon detector providing scanning-free, energy and spatially resolved X-ray imaging. Spatial resolution is achieved with the use of polycapillary optics guiding X-ray photons from small regions on a sample to distinct energy dispersive pixels on a charged-coupled device detector. Applying sub-pixel resolution, signals from individual capillary channels can be distinguished. Therefore, the SLcam® spatial resolution, which is normally limited to the pixel size of the charge-coupled device, can be improved to the size of individual polycapillary channels. In this work a new approach to a sub-pixel resolution algorithm comprising photon events also from the pixel centers is proposed. The details of the employed numerical method and several sub-pixel resolution examples are presented and discussed.