Anmelden

Open Access

  • Startseite
  • Suchen
  • Browsen
  • Veröffentlichen
  • Hilfe

Filtern

Autor

  • Hodoroaba, Vasile-Dan (2)
  • Mielke, Johannes (2)
  • Ortel, Erik (2)
  • Rades, Steffi (2)
  • Salge, T. (2)
  • Schmidt, R. (2)

Erscheinungsjahr

  • 2016 (1)
  • 2015 (1)

Dokumenttyp

  • Zeitschriftenartikel (1)
  • Beitrag zu einem Tagungsband (1)

Schlagworte

  • EDX (2) (entfernen)

Organisationseinheit der BAM

  • 6 Materialschutz und Oberflächentechnik (2)
  • 6.1 Oberflächenanalytik und Grenzflächenchemie (2)

2 Treffer

  • 1 bis 2
  • CSV
  • RIS
  • 10
  • 20
  • 50
  • 100

Sortieren nach

  • Jahr
  • Jahr
  • Titel
  • Titel
  • Autor
  • Autor
Characterisation of nanoparticles by means of high-resolution SEM/EDS (2015)
Hodoroaba, Vasile-Dan ; Rades, Steffi ; Salge, T. ; Mielke, Johannes ; Ortel, Erik ; Schmidt, R.
Advances in scanning electron microscopy (SEM) enable the high-resolution imaging of single nanoparticles (NPs) with sizes well below 10 nm. The SEM analysis in transmission mode (T-SEM) of NPs on thin film supports has many benefits when compared to the analysis of NPs on bulk substrates. The enhanced material (mass - thickness) contrast of the T-SEM imaging mode is well suited for in-depth and, particularly valuable, to very accurate, traceable, lateral dimensional measurements of NPs. Compared to samples prepared on bulk substrates, T-SEM with energy dispersive X-ray spectroscopy (EDS) achieves a drastically improved spatial resolution of the emitted X-rays. The poor signal-to-noise ratio of the X-ray spectra emitted by a single nanoparticle (NP) can be improved by the use of high-sensitivity (high collection solid angle) silicon drift (SDD), energy-dispersive X-ray spectrometers (EDS). The EDS spectral imaging of a single NP with a spatial resolution below 10 nm has become possible. This is demonstrated by means of various examples of nanostructures. Advanced data processing of T-SEM/EDS results sets the stage for the automated classification of NPs by feature analysis. This method combines the detection of morphological structures of interest by image processing of T-SEM micrographs with the chemical classification by EDS.
Characterisation of nanoparticles by means of high-resolution SEM/EDS in transmission mode (2016)
Hodoroaba, Vasile-Dan ; Rades, Steffi ; Salge, T. ; Mielke, Johannes ; Ortel, Erik ; Schmidt, R.
Advances in scanning electron microscopy (SEM) enable the high-resolution imaging of single nanoparticles (NPs) with sizes well below 10 nm. The SEM analysis in transmission mode (T-SEM) of NPs on thin film supports has many benefits when compared to the analysis of NPs on bulk substrates. The enhanced material (mass – thickness) contrast of the T-SEM imaging mode is well suited for in-depth and, particularly valuable, to very accurate, traceable, lateral dimensional measurements of NPs. Compared to samples prepared on bulk substrates, T-SEM with energy dispersive X-ray spectroscopy (EDS) achieves a drastically improved spatial resolution of the emitted X-rays. The poor signal-to-noise ratio of the X-ray spectra emitted by a single nanoparticle (NP) can be improved by the use of high-sensitivity (high collection solid angle) silicon drift (SDD), energy-dispersive X-ray spectrometers (EDS). The EDS spectral imaging of a single NP with a spatial resolution below 10 nm has become possible. This is demonstrated by means of various examples of nanostructures. Advanced data processing of T-SEM/EDS results sets the stage for the automated classification of NPs by feature analysis. This method combines the detection of morphological structures of interest by image processing of T-SEM micrographs with the chemical classification by EDS.
  • 1 bis 2

OPUS4 Logo

  • Kontakt
  • Impressum
  • Sitelinks