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- 2019 (2) (entfernen)
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- Thermography (2)
- Blind structured illumination (1)
- Heat diffusion (1)
- Laser thermography (1)
- NDT (1)
- Structured heating (1)
- Subsurface defects (1)
- Super-resolution imaging (1)
- Thermal wave (1)
- VCSEL (1)
Organisationseinheit der BAM
Photothermal radiometry with an infrared camera allows the contactless temperature measurement of multiple surface pixels simultaneously. A short light pulse heats the sample. The heat propagates through the sample by diffusion and the corresponding temperature evolution is measured at the sample’s surface by an infrared camera. The main drawback in radiometric imaging is the loss of the spatial resolution with increasing depth due to heat diffusion, which results in blurred images for deeper lying structures. We circumvent this information loss due to the diffusion process by using blind structured illumination, combined with a non-linear joint sparsity reconstruction algorithm. The structured illumination is realized by parallel laser lines from a vertical-cavity surface-emitting laser (VCSEL) array controlled by a random binary pattern generator. By using 150 different patterns of structured illumination and our iterative joint sparsity algorithm, it was possible to resolve 1 mm thick lines at a distance down to 0.5 mm, which results in a resolution enhancement of approximately a factor of four compared to the resolution of 5.9 mm for homogenous illuminated thermographic reconstruction.
We report on photothermal detection of subsurface defects by coherent superposition of thermal wave fields. This is made possible by structured heating using high-power VCSEL laser arrays whose individual emitter groups can be arbitrarily controlled. In order to locate the defects, we have developed a scanning method based on the continuous wavelet transformation with complex Morlet wavelet using the destructive interference effect of thermal waves. This approach can also be used for thermally very fast and highly reflective materials such as uncoated aluminum. We show that subsurface defects at an aspect ratio of defect width to defect depth down to 1/3 are still detectable in this material.