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In this article the progress of the research on cement hydration mechanisms is critically reviewed, starting with the work of Le Chatelier and Michaelis during the late 19th century. Proposed mechanisms are discussed in the light of experimental data to highlight the role of new or improved analytical techniques. The focus of this article lies on the dormant period and the silicate reaction.
Today many of the mechanisms proposed throughout time cannot withstand experimental evidence and need to be rejected, including the classical protective hydrate layer theory. However, it seems likely that hydrated surface species are involved in the mechanism. Theories that aim to explain the rate changes solely based on the nucleation and growth of portlandite can also not withstand experimental evidence. Nevertheless, the retardation of portlandite crystal growth through silicate ions is a relevant factor. Especially since it might present a mechanism for the nucleation of calcium silicate hydrate (C-S-H), backing up theories that propose C-S-H and portlandite to grow from the same nuclei.
Finally, an overview over facts, that are currently considered to be valid and hence need to be regarded in future mechanisms is given.
Analyzing materials composed of multiple elements with spectroscopic techniques such as X-ray Photoelectron Spectroscopy (XPS), Auger-Electron Spectroscopy (AES) or Electron Probe Microanalysis (EPMA), can be challenging due to spectral overlap. Moreover, each analytical method introduces its own set of challenges, e.g., the strong secondary fluorescence effect for neighbor elements in EPMA, thus, making the accurate elemental quantification in such materials difficult. When the material is available as thin film, additional constraints are inherently present. To provide a reference material for these analytical challenges high entropy alloys (HEAs) are excellent candidates. Currently, there is no thin film reference available containing more than 2 elements.
Unlike traditional alloys, which typically consist of one or two main elements and smaller amounts of secondary elements, HEAs are characterized by the presence of multiple principal elements in almost equal proportions. This unique composition results in a high degree of disorder at the atomic level, leading to exceptional mechanical, physical, and often unexpected properties. HEAs have garnered significant attention in materials science and engineering due to their potential applications in a wide range of industries, from aerospace and automotive to electronics and renewable energy.
For the preparation of a dedicated thin film reference material, we have chosen to prepare HEAs by magnetron sputtering, since it is not associated with elemental segregation that may occur due to the high configurational entropy of HEAs, which promotes atomic rearrangements. Our goal was to prepare films with a homogeneous thickness and defined chemical composition to be analyzed by various methods dedicated to surface analysis.
The material, consisting of titanium, chromium, manganese, iron, and nickel was deposited as film on silicon substrates - to our knowledge the first HEA thin film of this type reported in literature. A set of different thickness of the films was chosen, on the one hand to facilitate the analysis with different techniques, and on the other side to evaluate the limitations of the respective methods. The films morphology was characterized as prepared by SEM followed by the analysis of their 2D compositional homogeneity by EDX, XRF, ToF-SIMS and XPS. in-depth chemical composition was evaluated by ToF-SIMS and AES. The outcomes of analyzing the initial batches of films will be presented.