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Eingeladener Vortrag
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Measuring perceived air quality and intensity by a Sensor System, the European Project SysPAQ
(2008)
Messung der empfundenen Geruchsintensität mit Multigas-Sensorsystemen, das Forschungsvorhaben SysPAQ
(2007)
Kunststoff- und Kunststoffrasenflächen kommt bei intensiv genutzten Flächen als Allwetterbeläge eine große Bedeutung zu. Sie leisten einen wichtigen Beitrag zur Absicherung eines ganzjähriger Sportangebote.
Gerade Kunststoffrasen ist aber in den letzten Jahren häufig in die Kritik geraten, insbesondere durch gefährliche Inhaltsstoffe und andere negative Einflüsse auf die Umwelt. Dies hat bei Bauherren zu einer Verunsicherung geführt und Fragen aufgeworfen, die erst teilweise beantwortet sind. Die Diskussionen rund um diesen Allwetterbelag haben bereits dazu geführt, dass von Seiten der Industrie viel verändert wurde und neue innovative Lösungen gefunden werden.
Der Fachbericht stellt eine Handreichung für Fachleute und interessierte Laien dar, um mehr Klarheit besonders hinsichtlich der Umweltanforderungen zu erzielen.
A variety of methods used to prepare nano-objects for surface analysis are described along with information about when they might be best applied. Intrinsic properties of NPs which complicate their characterization and need to be considered when planning for surface or other analyses of NPs are identified, including challenges associated with reproducible synthesis and functionalization of the particles as well as their dynamic nature. The relevant information about the sample preparation processes, along with analysis details and data that need to be added to the collection of material provenance information is identified. Examples of protocols that have been successfully used for preparation of nano-objects for surface analysis are included in an annex.
Results are reported from a pilot study under the Consultative Committee for Amount of Substance (CCQM) to compare measurements of and resolve any relevant measurement issues in, the amount of thermal SiO2 oxide on (100) and (111) orientation Si wafer substrates in the thickness range 1.5 - 8 nm. As a result of the invitation to participate in this activity, 45 sets of measurements have been made in different laboratories using 10 analytical methods: medium-energy ion scattering spectrometry (MEIS), nuclear reaction analysis (NRA), RBS, elastic backscattering spectrometry (EBS), XPS, SIMS, ellipsometry, grazing-incidence x-ray reflectrometry (GIXRR), neutron reflectometry and transmission electron microscopy (TEM). The measurements are made on separate sets of 10 carefully prepared samples, all of which have been characterised by a combination of ellipsometry and XPS using carefully established reference conditions and reference parameters.
The results have been assessed against the National Physical Laboratory (NPL) data and all show excellent linearity. The remaining data sets correlate with the NPL data with average root-mean-square scatters of 0.15 nm, half being better than 0.1 nm and a few at or better than 0.05 nm. Each set of data allows a relative scaling constant and a zero thickness offset to be determined. Each method has an inherent zero thickness offset between 0 nm and 1 nm and it is these offsets, measured here for the first time, that have caused many problems in the past. There are three basic classes of offset: water and carbonadeous contamination equivalent to ~1 nm as seen by ellipsometry; adsorbed oxygen mainly from water at an equivalent thickness of 0.5 nm as seen by MEIS, NRA, RBS and possibly GIXRR; and no offset as seen by XPS using the Si 2p peaks. Each technique has a different uncertainty for the scaling constant and consistent results have been achieved. X-Ray photoelectron spectroscopy has large uncertainties for the scaling constant but a high precision and, critically, if used correctly, has zero offset. Thus, a combination of XPS and the other methods allows the XPS scaling constant to be determined with low uncertainty, traceable via the other methods. XPS laboratories returning results early were invited to test a new reference procedure. All showed very significant improvements. The reference attenuation lengths thus need scaling by 0.986 ± 0.009 (at an expansion factor of 2) deduced from the data for the other methods. Several other methods have small offsets and, to the extent that these can be shown to be constant or measurable, then these methods will also show low uncertainty. Recommendations are provided for parameters for XPS, MEIS, RBS and NRA to improve their accuracy.