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The molecular mobility of amorphous ibuprofen has been investigated by broadband dielectric relaxation spectroscopy (DRS) covering a temperature range of more than 200 K. Four different relaxation processes, labeled as α, β, γ, and D, were detected and characterized, and a complete relaxation map was given for the first time. The γ-process has activation energy Ea = 31 kJ·mol-1, typical for local mobility. The weak β-relaxation, observed in the glassy state as well as in the supercooled state was identified as the genuine Johari-Goldstein process. The temperature dependence of the relaxation time of the α-process (dynamic glass transition) does not obey a single VFTH law. Instead two VFTH regimes are observed separated by a crossover temperature, TB = 265 K. From the low temperature VFTH regime, a Tgdiel(t =100 s) = 226 K was estimated, and a fragility or steepness index m = 93, was calculated showing that ibuprofen is a fragile glass former. The D-process has a Debye-like relaxation function but the temperature dependence of relaxation time also follows the VFTH behavior, with a Vogel temperature and a pre-exponential factor which seem to indicate that its dynamics is governed by the α-process. It has similar features as the Debye-type process observed in a variety of associating liquids, related to hydrogen bonding dynamics. The strong tendency of ibuprofen to form hydrogen bonded aggregates such as dimers and trimers either cyclic or linear which seems to control in particular the molecular mobility of ibuprofen was confirmed by IR spectroscopy, electrospray ionization mass spectrometry, and MD simulations.
This paper discloses two high-sensitivity probes for Eddy Current Nondestructive Test (NDT) of buried and surface defects. These probes incorporate eight and 32 magnetoresistive sensors, respectively, which are optimized for high sensitivity and spatial resolution. The signal processing and interfacing are carried out by a full-custom application-specific integrated circuit (ASIC). The ASIC signal chain performs with a thermal input-referred noise of 30 nV/√Hz at 1 kHz, with 66 mW of power consumption, in a die with 3.7 × 3.4 mm 2 . NDT results are presented, showing that there is an increase in spatial resolution of surface defects when contrasted to prior art, enabling the probes to resolve defects with diameters of 0.44 mm, pitches of 0.6 mm, and minimum edge distance as low as 0.16 mm. The results also show that the probe for buried defects is a good all-round tool for detection of defects under cladding and multiple-plate flat junctions.