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Characterization of bio-molecular surfaces and liquids by means of reference-free X-ray spectrometry
(2016)
An increasing field of application for X-ray spectrometry and related analysis techniques is the investigation of tailor made functional surfaces modified by organic molecules. For a detailed understanding and further development of such functionalized surfaces, a quantitative determination of the surface density of molecular species or even specific functional groups is required. By means of reference-free X-Ray Fluorescence (XRF) spectrometry such customized surfaces can be analyzed quantitatively, when using specific marker elements. A chemical analysis of molecular bonds can be accomplished by X-Ray Absorption Spectroscopy in the Near-Edge region (NEXAFS). Especially in the soft X-ray range an access to relevant light elements like carbon C, nitrogen N and oxygen O is possible. Especially, the characterization of liquids and solid-liquid interfaces aiming at the determination of bio-molecular moieties (functional groups) is of great interest. The characterization of such systems requires the analysis of bio-molecules in their liquid environment. For the understanding of (biomolecular) reactions and binding processes the verification and quantification of biomolecule immobilization is essential. However, the analysis in the soft-X-ray range involves a higher experimental effort. In this contribution various successful applications of the characterizations of organofunctionalized surfaces, solid-liquid interfaces and liquids containing bio-molecular species by means of reference-free X-ray spectrometry will be presented. The experiments were performed at the plane-grating monochromator beamline (PGM-U49) in the soft X-ray range at the synchrotron radiation facility BESSY II. Using calibrated instrumentation and a quantification approach based on atomic fundamental parameters a quantitative access without any calibration sample or reference material is possible. In a complementary analysis by X-Ray Photoelectron Spectroscopy (XPS) and fluorescence measurements based on laserexcitation in the optical light spectrum the functional-group density of silane monolayers were determined. Here, the nitrogen atoms of the head-group of the label molecule employed could be used as specific marker for the reference-free quantitative XRF analysis and is used for traceable calibration of XPS and fluorescence spectroscopy. Furthermore, a novel UHV-compatible liquid-cell developed to investigate liquids and solidliquid interfaces will be presented. Protein attachment at the solid-liquid interface was investigated by detection of the characteristic N1s→π*(O=C-N) amide bond resonance in the N K-edge NEXAFS by using ultra-thin epoxy-functionalized SiC-windows.
Characterization of bio-molecular nano-layers by means of reference-free X-ray Spectrometry
An increasing field of application, e.g. in biotechnology is the dedicated adjustment of surface properties by functionalization with organic molecules. For a detailed understanding and further development of such nano-layers, a quantitative determination of the surface density of molecular species is required.
By means of reference-free X-Ray Fluorescence (XRF) spectrometry such surfaces can be analyzed quantitatively by detecting specific marker elements. Using calibrated instrumentation and a quantification approach based on atomic fundamental parameters a SI-traceable quantitative analysis without any calibration sample or reference material is possible. A chemical analysis of molecular bonds can be accomplished by X-Ray Absorption Spectroscopy in the Near-Edge region (NEXAFS). Especially in the soft X-ray range an access to relevant light elements like Carbon C, Nitrogen N and Oxygen is possible.
Here, aminated surfaces with varying densities of amino groups prepared from binary mixtures of silanes were investigated. In a complementary analysis by X-Ray Photoelectron Spectroscopy (XPS) and Fluorescence measurements based on laser-excitation in the optical light spectrum the functional-group density of silane monolayers were determined. The nitrogen atom in the head-group of the silane-molecule could be used as specific marker for the reference-free quantitative XRF analysis and were used for traceable calibration of XPS and Fluorescence Spectroscopy.
X-ray fluorescence (XRF) analysis is a well suited methodology for thin film analysis. With XRF the mass deposition of elements can be non-destructively determined. By knowledge of the density of the thin film as well the thickness can be given. In the field of industrial thin film manufacturing various material systems and layer structures are used. the analysis relies on well-known calibration samples or even reference materials to determine absolute analytical results from the measurement values recorded. Within this concept of chemical traceability the calibration sample has to be as similar as possible to the industrial thin film sample with respect to the spatial distribution of elemental composition in order to minimize matrix effects or analysis related uncertainties. The procurement of such certified similar calibration samples or reference materials including their required traceability is a challenge due to limited number of available calibration samples or reference materials, in particular at the nanoscale. There are only few providers of calibration standards for layer or coating thicknesses which are suitable for XRF analysis. The limited number of available certified reference materials (CRMs) for XRF thin film analysis and in parallel the growing market of novel thin film materials induces a growing gap of required calibration samples for XRF analysis.
The exploitation of process-near samples benefits from a leverage effect: on one hand reference materials are needed for calibration and alignment procedures for X-ray fluorescence devices. They are customized for the special need of the end-user, e.g. a company producing thin film solar cells. On the other hand the market for EDXRF devices develops positively by providing novel thin film calibration samples for industry and end user-related production processes or application. Two aspects are hereby being addressed; the improvement of product quality which in certain sectors like aerospace and automotive industry directly translates to product safety as well as the expansion of the sales potential of EDXRF measuring devices.