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- 2011 (3) (entfernen)
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- Zeitschriftenartikel (3) (entfernen)
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- Englisch (3)
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- Abri Pataud (1)
- Chalcopyrite-type (1)
- Chemical mapping (1)
- Comparison (1)
- Cu(In,Ga)Se2 (1)
- Depth profiling (1)
- Elemental distributions (1)
- Final Gravettian (1)
- Gravettien final (1)
- Ivoire de mammouth (1)
During the mineralisation of metal carbonates MCO3 (M = Ca, Sr, Ba, Mn, Cd, Pb) liquid-like amorphous intermediates emerge. These intermediates that form via a liquid/liquid phase separation behave like a classical emulsion and are stabilized electrostatically. The occurrence of these intermediates is attributed to the formation of highly hydrated networks whose stability is mainly based on weak interactions and the variability of the metal-containing pre-critical clusters. Their existence and compositional freedom are evidenced by electrospray ionization mass spectrometry (ESI-MS). Liquid intermediates in non-classical crystallisation pathways seem to be more common than assumed.
The Final Gravettian level (level 2) of the abri Pataud (Dordogne, France) yielded a large assemblage of body ornaments that consists essentially of 85 quite standardized rectangular beads. Some uncertainty remained about the raw material in which these small beads were made: mammoth ivory, reindeer antler or bone? Non-invasive methods were employed in order to determine the raw material. First chemical analyses using microbeam Proton Induced X-ray Emission analysis (microPIXE) did not enable us to conclude definitively. Therefore, synchrotron and laboratory X-ray microtomography (microCT) were applied on eight beads and allowed us to identify ivory for all of them except for one, which shows slightly different morphological features.
The present work shows results on elemental distribution analyses in Cu(In,Ga)Se2 thin films for solar cells performed by use of wavelength-dispersive and energy-dispersive X-ray spectrometry (EDX) in a scanning electron microscope, EDX in a transmission electron microscope, X-ray photoelectron, angle-dependent soft X-ray emission, secondary ion-mass (SIMS), time-of-flight SIMS, sputtered neutral mass, glow-discharge optical emission and glow-discharge mass, Auger electron, and Rutherford backscattering spectrometry, by use of scanning Auger electron microscopy, Raman depth profiling, and Raman mapping, as well as by use of elastic recoil detection analysis, grazing-incidence X-ray and electron backscatter diffraction, and grazing-incidence X-ray fluorescence analysis. The Cu(In,Ga)Se2 thin films used for the present comparison were produced during the same identical deposition run and exhibit thicknesses of about 2 µm. The analysis techniques were compared with respect to their spatial and depth resolutions, measuring speeds, availabilities, and detection limits.