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- 2014 (3) (entfernen)
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Schlagworte
The effects of refraction (phase-contrast) are normally considered as disturbances in high-resolution μCT-measurements. We show that in the case of small objects with low absorption a single-distance phase-retrieval algorithm not only reduces the edge enhancement, but also raises the signal-to-noise ratio sufficiently to allow dimensional measurements. This is exemplified at an optical element for optical fibre connectors.
Sollten CT Aufnahmen quantitativ und automatisch ausgewertet werden, ist die Qualität der Tomogramme ein wesentlicher Punkt. Außerdem steht bei Serienmessungen nur eine begrenzte Meßzeit für jede Probe. Es werden die verschiedenen Mikrofokusröhren in Bezug auf die Parameter Orts- und Dichteauflösung, sowie Meßzeit verglichen, CT Beispiele dazu gezeigt.
The combination of tomographic, microstructural data with other experimental techniques and with modeling is paramount, if we want to extract the maximum amount of information on material and component properties. In particular, quantitative image analysis, statistical approaches, direct discretization of tomographic reconstructions represent concrete possibilities to extend the power of the tomographic 3D representation to insights into the material and component performance. This logic thread holds equally for industrial and academic research, and valorizes expensive experiments such as those carried out at synchrotron sources, which cannot be daily repeated. We shall show a few examples of possible use of X-ray tomographic data for quantitative assessment of damage evolution and microstructural properties, as well as for non-destructive testing. We will also show how X-ray refraction computed tomography (CT) can be highly complementary to classic absorption CT, being sensitive to internal interfaces.