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- Computed tomography (19) (entfernen)
Organisationseinheit der BAM
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Paper des Monats
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The material and damage behaviour of additively manufactured polyamide 12 under cyclic loading was characterized by cyclic tests and microstructure analysis by using microscopy, X-ray refraction, and computed tomography. The results were used to determine parameters for the viscoplastic material model by Chaboche and a damage model by Gurson-Tvergaard-Needleman. The temperature was monitored during the experiments and the self-heating effect was observed. By including this effect, a higher accuracy could be achieved with the results of mechanical experiments.
In order to characterise the material and damage behaviour of additively manufactured polyamide 12 (PA12) under quasi-static load and to implement it in a numerical model, experiments under quasi-static load as well as microstructural investigations were carried out. Selective laser sintering (SLS) was used as the manufacturing process. For the classification of the material behaviour, quasi-static cyclic tests with holding times as well as tensile tests were performed. X-ray refraction and computed tomography (CT) were used to investigate the damage behaviour. The Chaboche model, which has already been applied for metallic materials under thermomechanical loading, served as the basis for the selection of the numerical material model. The same procedure was used for the selection of the damage model, where the Gurson–Tvergaard–Needleman (GTN) model was chosen, which was already used for porous metallic materials. The Chaboche model shows very good agreement with experimental results. Furthermore, the coupling with the GTN model allows a very good modelling of the damage behaviour. Finally, it could be shown that the selected models are suitable to simulate the material and damage behaviour of 3D printed PA12.
A novel approach is suggested to strongly suppress artifacts in radiography and computed tomography caused by the effect of diffuse background signals 'backlighting' of 2D X-ray detectors. Depending on the detector geometry the mechanism may be different. Either based on the optical scattering of the fluorescent screen materials into the optical detection devices or Compton or X-ray fluorescence scattering by the detector components. Consequently, these erroneous intensity portions result in locally different violations of Lambert Beer's law in single projections (radiographs) as a function of the detector area coverage and the magnitude of the attenuation. The absorption of multiple metal sheets is investigated by monochromatic synchrotron radiation, thus excluding beam hardening. The proposed correction procedure simply requires the individual subtraction of one and the same fraction of the primary and transmitted mean intensity, as a constant (non-local) scattering mechanism is assumed.
A novel approach to strongly suppress artifacts in radiography and computed tomography caused by the effect of diffuse background Signals (backlight) of 2D X-ray detectors is suggested. Depending on the detector geometry the mechanism may be different, either based on the optical scattering of the fluorescent screen materials into optical detection devices or Compton or X-ray fluorescence scattering by the detector components. Consequently, these erroneous intensity portions result in locally different violations of Lambert Beers law in single projections (radiographs).
When used as input data for computed tomography these violations are directly observed via modulation of the projected mass as a function of the rotation Phase and the samples aspect ratio (dynamics). The magnitude of the diffuse Background signal depends on the detector area covered by the projected sample. They are more pronounced the smaller the shaded area and the stronger the total attenuation.
Moreover, the local intensity mismatch depends on the attenuation of the sample.
We present very basic reference data measured with multiple metal foils at a synchrotron radiation source. Beam hardening artifacts can be excluded due to the monochromatic radiation. The proposed correction procedure assumes a constant (non-local) scattering mechanism.
A novel approach to strongly suppress artifacts in radiography and computed tomography caused by the effect of diffuse background signals ('backlighting') of 2D X-ray detectors is suggested. Depending on the detector geometry the mechanism may be different, either based on the optical scattering by the fluorescent screen materials into optical detection devices or Compton or X-ray fluorescence scattering by the detector components. Consequently, these erroneous intensity portions result in locally different violations of Lambert–Beer's law in single projections (radiographs). When used as input data for computed tomography these violations are directly observed via modulation of the projected mass as a function of the rotation phase and the samples aspect ratio (dynamics). The magnitude of the diffuse background signal depends on the detector area covered by the projected sample. They are more pronounced the smaller the shadowed area and the stronger the total attenuation. This implies that the reconstruction suffers from additional anisotropic artifacts caused by elongated sample structures. This issue is studied simply by absorption of flat plates in a conventional laboratory radiography set-up and at a synchrotron radiation facility. In the latter case beam hardening artifacts can be excluded due to the monochromatic radiation. The proposed correction procedure requires simple integral intensity offsets as a constant (non-local) light scattering mechanism is assumed.
Analyser-based imaging expands the performance of X-ray imaging by utilizing not only the absorption properties of X-rays but also the refraction and scatter rejection (extinction) properties. In this study, analyser-based computed tomography has been implemented on imaging an articular cartilage sample, depicting substructural variations, without overlay, at a pixel resolution of 3.6 µm.
Erstmals wurden MMCs mit Hilfe der Interface-Kontrast verstärkenden Röntgen-Refraktions-Technik in Kombination mit der 3D-CT-Technik untersucht. Die Methode der Röntgen-Refraktions-Topography sowie der Röntgen-Refraktions-Tomography wurden in den letzten Jahren speziell für die zerstörungsfreie Charakterisierung von Leichtbau-Hochleistungs-Werkstoffen wie Verbund-Werkstoffen und Keramiken entwickelt. Die Technik basiert auf der Refraktion von Röntgenlicht an Grenzflächen zwischen Bereichen unterschiedlicher Elektronendichte wie z.B. Faser- und Matrix-Werkstoff. Auf Grund der kurzen Röntgen-Wellenlänge hat der Brechungsindex einen Wert dicht bei eins, sodass der Streuwinkel nur wenige Bogenminuten beträgt. Der Vorteil der kurzen Wellenlänge besteht jedoch darin, dass Poren und Risse detektiert werden können, deren Größe im Nanometerbereich liegen. Damit kann die Refraktions-Technik zum besseren Verständnis von Mikro- und Submikro-Strukturen in der Materialwissenschaft eingesetzt werden. Mit der hier vorgestellten Refraktions-CT wurden Ermüdungsmechanismen an MMCs, bestehend aus SiC-Faser verstärktem Titan (Ti6242) untersucht. Die Messungen wurden am Röntgen-Messplatz der BAM (BAMline) am Synchrotron-Speicherring-BESSY in Berlin Adlershof durchgeführt.
Rekonstruktion unvollständiger computertomografischer Modelldatensätze mit Directt-Algorithmus
(2010)
Modellrechnungen zur Rekonstruktion unvollständiger computertomographischer Datensätze werden zur Ermittlung der Vorteile des neuen Directt-Algorithmus gegenüber der konventionellen gefilterten Rückprojektion durchgeführt, insbesondere auch zur Vermeidung experimentell begründeter Unwägbarkeiten. Ein entsprechender Bedarf entsteht seitens erweiterter Forschungsaktivitäten und industrieller Bedürfnisse, wo die Rekonstruktion limitierter Messdatensätze von Artefakten dominiert wird. Die bekanntesten Einschränkungen betreffen das Limited-View- und Few-Angles-Problem sowie die ROI-Situation, die jeweils unabhängig voneinander untersucht werden, in der Anwendung jedoch zumeist undefiniert vermischt sind, wie etwa in der Elektronen-Tomografie. Die hochauflösende Rekonstruktion von Einzelpixeln wird durch die Wahl eines kleinen Modells von nur 1012 Pixeln visualisiert und ist ohne Filterung möglich. Rekonstruktionen von 90°-Sektoren oder 50 % -ROI-Querschnitten sind fast ohne Auflösungseinschränkungen realisierbar. Die bisher nicht bekannte Möglichkeit, auch außerhalb der ROI präzise zu rekonstruieren, wurde als "Extended ROI"-Methode erfolgreich erprobt.