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Broadband dielectric spectroscopy (BDS), specific heat spectroscopy (HCS) and capacitive scanning dilatometry (CSD) are used to study the glass transition and segmental dynamics in thin supported polystyrene (PS) films. Different molecular weights (Mw = 50 kg/mol, Mw = 260 kg/mol, Mw = 1408 kg/mol) and annealing protocols are employed in the study. The segmental dynamics is independent of the film thickness for each Mw in the temperature window of the dielectric measurement. The thermal glass transition temperature, Tg, measured by CSD depends on the film thickness and shows also a dependence on Mw. These observations are explained in terms of the formation of irreversibly adsorbed layer due to chain adsorption on the Al substrates during annealing.
Specific heat spectroscopy in the frequency range typically from 1 Hz to 1 kHz with a sensitivity of pJ/K was employed to study the glass transition behavior of ultrathin poly(vinyl methyl ether) (PVME) films with thicknesses ranging from 218 nm down to 12 nm. The amplitude and the phase angle of the complex differential voltage as a measure of the complex heat capacity were obtained as a function of temperature at a given frequency simultaneously. Both spectra are used to determine the dynamic glass transition temperature as a function of both the frequency and the film thickness. As main result no thickness dependence of the dynamic glass transition temperature was observed down to a film thickness of 12 nm within the experimental uncertainty of ±2 K. Further the width of the glass transition is independent of the film thickness which indicates that the extent of the cooperativity is essentially smaller than 12 nm.