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- Ellipsometry (2)
- XPS (2)
- 3D TEM (1)
- Acoustic emissions analysis (1)
- Alkali-silica reaction (1)
- Bauprodukte (1)
- Bulk metallic glasses (1)
- Calibration (1)
- Ceramic matrix composite (1)
- Ceria (1)
Organisationseinheit der BAM
Results are reported from a pilot study under the Consultative Committee for Amount of Substance (CCQM) to compare measurements of and resolve any relevant measurement issues in, the amount of thermal SiO2 oxide on (100) and (111) orientation Si wafer substrates in the thickness range 1.5 - 8 nm. As a result of the invitation to participate in this activity, 45 sets of measurements have been made in different laboratories using 10 analytical methods: medium-energy ion scattering spectrometry (MEIS), nuclear reaction analysis (NRA), RBS, elastic backscattering spectrometry (EBS), XPS, SIMS, ellipsometry, grazing-incidence x-ray reflectrometry (GIXRR), neutron reflectometry and transmission electron microscopy (TEM). The measurements are made on separate sets of 10 carefully prepared samples, all of which have been characterised by a combination of ellipsometry and XPS using carefully established reference conditions and reference parameters.
The results have been assessed against the National Physical Laboratory (NPL) data and all show excellent linearity. The remaining data sets correlate with the NPL data with average root-mean-square scatters of 0.15 nm, half being better than 0.1 nm and a few at or better than 0.05 nm. Each set of data allows a relative scaling constant and a zero thickness offset to be determined. Each method has an inherent zero thickness offset between 0 nm and 1 nm and it is these offsets, measured here for the first time, that have caused many problems in the past. There are three basic classes of offset: water and carbonadeous contamination equivalent to ~1 nm as seen by ellipsometry; adsorbed oxygen mainly from water at an equivalent thickness of 0.5 nm as seen by MEIS, NRA, RBS and possibly GIXRR; and no offset as seen by XPS using the Si 2p peaks. Each technique has a different uncertainty for the scaling constant and consistent results have been achieved. X-Ray photoelectron spectroscopy has large uncertainties for the scaling constant but a high precision and, critically, if used correctly, has zero offset. Thus, a combination of XPS and the other methods allows the XPS scaling constant to be determined with low uncertainty, traceable via the other methods. XPS laboratories returning results early were invited to test a new reference procedure. All showed very significant improvements. The reference attenuation lengths thus need scaling by 0.986 ± 0.009 (at an expansion factor of 2) deduced from the data for the other methods. Several other methods have small offsets and, to the extent that these can be shown to be constant or measurable, then these methods will also show low uncertainty. Recommendations are provided for parameters for XPS, MEIS, RBS and NRA to improve their accuracy.
Measuring perceived air quality and intensity by a Sensor System, the European Project SysPAQ
(2008)
Messung der empfundenen Geruchsintensität mit Multigas-Sensorsystemen, das Forschungsvorhaben SysPAQ
(2007)
Liquid adsorption chromatography at critical conditions (LACCC) in normal and in reversed-phase modes provides independent information on the molar mass distributions of both blocks of poly(methyl methacrylate)-block-poly(tert-butyl methacrylate), even if no information about the precursor is available. In addition, the amount of unreacted precursor can be determined, even if its molar mass is comparable to that of the total block copolymer. The reversal of elution order by changing of stationary and mobile phases makes it possible to independently characterize each block in the SEC mode of the LACCC system. Thus, complete structural information is obtained even without using two-dimensional chromatographic techniques.
Lithium disilicate, leucite and apatite glass-ceramics have become state-of-the-art framework materials in the fabrication of all-ceramic dental restorative materials. The goal of this study was to examine the crack propagation behaviour of these three known glass-ceramic materials after they have been subjected to Vickers indentation and to characterize their crack opening profiles (δmeas vs. (a-r)). For this purpose, various methods of optical examination were employed. Optical microscopy investigations were performed to examine the crack phenomena at a macroscopic level, while high-resolution techniques, such as scanning electron microscopy (SEM) and atomic force microscopy (AFM), were employed to investigate the crack phenomena at a microscopic level. The crack patterns of the three glass-ceramics vary from fairly straightforward to more complex, depending on the amount of residual glass matrix present in the material. The high-strength lithium disilicate crystals feature a high degree of crosslinking, thereby preventing crack propagation. In this material, the crack propagates only through the residual glass phase, which constitutes 30%40% by volume. Having a high glass content of more than 65% by volume, the leucite and apatite glass-ceramics show far more complex crack patterns. Cracks in the leucite glass-ceramic propagate through both the glass and crystal phase. The apatite glass-ceramic shows a similar crack behaviour as an inorganicorganic composite material containing nanoscale fillers, which are pulled out in the surroundings of the crack tip. The observed crack behaviour and the calculated View the MathML source values of the three types of glass-ceramics were compared to the Kkic values determined according to the SEVNB method.