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The reliability investigations are dedicated to throw light on the performance of the NDE system with
respect to the required aim. This is especially of interest when digitized and processed signals are
involved where it becomes hard to assess whether the quality of the system has raised or not. Three
different ways to investigate reliability of NDE signals will be described. The first way of investigation,
the performance demonstration, is preferred e.g. in the US American nuclear power industry. This is an
integral consideration of the non destructive test as a system where the whole NDE system is packed in a
black box and only the input in terms of the real existing flaws in the component is considered and
compared to the output in terms of the indications of the human inspector or of the automated system.
The second the European tradition relies on a standardized description of physical/technical
parameters of the NDE system which are preconditions for successful system performance. An example
for such a standardized set of performance parameters is given in the recently released standard about Xray
film digitization CEN EN 14096. The third approach the modular conception is a marriage of
both: The signal chain is cut into main modules. Each module is assessed in a most appropriate
individual way e.g. via modeling calculations. The single results are joint together according to the
reliability of the subsystems. Separating criteria for the system were proposed through a reliability
formula developed during a series of European-American workshops on NDE reliability. Examples of
all three approaches will be given.
Tomographical Computer Aided Radiology (TomoCAR) is based on the mechanical position control of
an X-ray tube in front of a welding seam and the application of a planar array detector behind it. Several hundred
radiometric projections in small angle steps are acquired. The tomographical reconstruction allows the three-dimensional
(3D) representation of the defects. A new radiometric array detector system with a small internal
unsharpness and high image contrast is used for the 2- and 3-dimensional visualization and sizing of planar defects
with a defect opening of less than 100 µm. This detector is based on a CMOS-flat panel with a direct converting
CdTe-single crystal layer. The small design allows the application of the mobile testing equipment for mechanized
X-ray inspection in industrial plants. The physical pixel size of the detector amounts to 0,1x0,1 mm². Nevertheless,
this system yields a better spatial resolution than indirect converting detectors (e.g. cameras with fluorescence
layers of Gd2O2S). It allows the reliable detection of planar defects with openings far below the detector pixel size
by subpixel resolution.
'TomoCAR' is qualified at present in the context with a German pilot study following to the ENIQ guidelines for
the employment within the nuclear power industry.