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Broadband dielectric spectroscopy (BDS), specific heat spectroscopy (HCS) and capacitive scanning dilatometry (CSD) are used to study the glass transition and segmental dynamics in thin supported polystyrene (PS) films. Different molecular weights (Mw = 50 kg/mol, Mw = 260 kg/mol, Mw = 1408 kg/mol) and annealing protocols are employed in the study. The segmental dynamics is independent of the film thickness for each Mw in the temperature window of the dielectric measurement. The thermal glass transition temperature, Tg, measured by CSD depends on the film thickness and shows also a dependence on Mw. These observations are explained in terms of the formation of irreversibly adsorbed layer due to chain adsorption on the Al substrates during annealing.
Broadband dielectric spectroscopy (BDS), capacitive scanning dilatometry (CSD) and differential ac-chip calorimetry (DACC) were used to examine the glass transition and segmental dynamics of ultrathin poly(bisphenol A carbonate) (PBAC) films. An increase of Vogel temperature (T0) as well as glass transition temperature (Tg) with decreasing film thickness was observed when the thickness is less than 20 nm. Moreover, the segmental relaxation time at a fixed temperature was found to increase for the aluminium (Al) capped PBAC films (<20 nm) in the BDS measurements, whereas in the DACC measurements no thickness dependency of the segmental dynamics was detected within the experimental error limit for the supported PBAC films (10-55 nm). These properties are discussed in terms of the thin film geometry and the relevant interfacial interaction between the polymer and the substrate.