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- Modelling (1)
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- SyXRF Quantifizierung (1)
- X-ray fluorescence (1)
- X-ray scattering (1)
X-ray scattering may contribute significantly to the spectral background of X-ray fluorescence (XRF) spectra. Based on metrological measurements carried out with a scanning electron microscope (SEM) having attached a well characterised X-ray source (polychromatic X-ray tube) and a calibrated energy dispersive X-ray spectrometer (EDS) the accuracy of a physical model for X-ray scattering is systematically evaluated for representative samples. The knowledge of the X-ray spectrometer efficiency, but also of the spectrometer response functions makes it possible to define a physical spectral background of XRF spectra. Background subtraction relying on purely mathematical procedures is state-of-the-art. The results produced by the analytical model are at least as reliable as those obtained by Monte-Carlo simulations, even without considering the very challenging contribution of multiple scattering. Special attention has been paid to Compton broadening. Relevant applications of the implementation of the analytical model presented in this paper are the prediction of the limits of detection for particular cases or the determination of the transmission of X-ray polycapillary lenses.
Quantification of energy dispersive SRXRF for the certification of reference materials at BAMline
(2010)
The certification of reference materials (CRMs) is one of the main tasks of the BAM Federal Institute for Materials Research and Testing. In this context CRMs for analytical chemistry play the dominant role. Traditionally, energy dispersive X-ray fluorescence (EDXRF) has been excluded from the final certification scheme. It has lacked the proof to be reliable enough due to peak overlapping and risks of incorrect background subtraction leading to unacceptable uncertainty and bias of the results. The development described aims at enabling ED-SRXRF to really contribute to certification by the aid of synchrotron radiation. This has been partly shown for macrocontents and has been successfully demonstrated for trace elements and thin layers. The method is based on a combination of measurements of pure elements or stoichiometric compounds as comparator materials and Monte Carlo simulations. Measurements have been performed at the BAMline, the hard X-ray beam line of the BAM at the synchrotron BESSY II in Berlin.