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Lock-in- and flash thermography are standard methods in active thermography. They are widely used in industrial inspection tasks e.g. for the detection of delaminations, cracks or pores. The requirements for the light sources of these two methods are substantially different. While lock-in thermography requires sources that can be easily and above all fast modulated, the use of flash thermography requires sources that release a very high optical energy in the very short time.
By introducing high-power vertical cavity surface emitting lasers (VCSELs) arrays to the field of thermography a source is now available that covers these two areas. VCSEL arrays combine the fast temporal behavior of a diode laser with the high optical irradiance and the wide illumination range of flash lamps or LEDs and can thus potentially replace all conventional light sources of thermography.
However, the main advantage of this laser technology lies in the independent control of individual array areas. It is therefore possible to heat not only in terms of time, but also in terms of space. This new degree of freedom allows the development of new NDT methods. We demonstrate this approach using a test problem that can only be solved to a limited extent in active thermography, namely the detection of very thin, hidden defects in metallic materials that are aligned vertically to the surface. For this purpose, we generate destructively interfering thermal wave fields, which make it possible to detect defects within the range of the thermal wave field high sensitivity. This is done without pre-treatment of the surface and without using a reference area to depths beyond the usual thermographic rule of thumb.
Among the photothermal methods, full-field thermal imaging is used to characterize materials, to determine thicknesses of layers, or to find inhomogeneities such as voids or cracks. The use of classical light sources such as flash lamps (impulse heating) or halogen lamps (modulated heating) led to a variety of nondestructive testing methods, in particular, lock-in and flash-thermography. In vertical-cavity surface-emitting lasers (VCSELs), laser light is emitted perpendicularly to the surface with a symmetrical beam profile. Due to the vertical structure, they can be arranged in large arrays of many thousands of individual lasers, which allows power scaling into the kilowatt range. Recently, a high-power yet very compact version of such a VCSEL-array became available that offers both the fast timing behavior of a laser as well as the large illumination area of a lamp. Moreover, it allows a spatial and temporal control of the heating because individual parts of the array can be controlled arbitrarily in frequency, amplitude, and phase. In conjunction with a fast infrared camera, such structured heating opens up a field of novel thermal imaging and testing methods. As a first demonstration of this approach, we chose a testing problem very challenging to conventional thermal infrared testing: The detection of very thin subsurface defects perpendicularly oriented to the surface of metallic samples. First, we generate destructively interfering thermal wave fields, which are then affected by the presence of defects within their reach. It turned out that this technique allows highly sensitive detection of subsurface defects down to depths in excess of the usual thermographic rule of thumb, with no need for a reference or surface preparation.
The coherent superposition of two anti-phased thermal wave fields creates a zone of destructive interference which is extremely sensitive to the presence of defects without any reference measurements.
Combining a high power laser with a spatial light modulator allows modulating phase and amplitude of an illuminated surface that induces spatially and temporally controlled thermal wave fields. The position and depth of defects are reconstructed from analysis of the Amplitude and Phase of the resulting photothermal signal. The proposed concept is experimentally validated and supported by numerical modeling.
We report on photothermal detection of subsurface defects by coherent superposition of thermal wave fields. This is made possible by structured heating using high-power VCSEL laser arrays whose individual emitter groups can be arbitrarily controlled. In order to locate the defects, we have developed a scanning method based on the continuous wavelet transformation with complex Morlet wavelet using the destructive interference effect of thermal waves. This approach can also be used for thermally very fast and highly reflective materials such as uncoated aluminum. We show that subsurface defects at an aspect ratio of defect width to defect depth down to 1/3 are still detectable in this material.