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Paper des Monats
- ja (2)
Eingeladener Vortrag
- nein (99)
Thin polyamide-6 films were exposed to fluorine gas and analysed with photoelectron and infrared spectroscopies. Fluorine cleaves the amide CN bond resulting in the formation of the COOH and NF2 terminal groups. This is evident from large shifts in the N1s binding energy (+5 eV) and C=O stretching frequency (~80 cm-1), appearance of ester oxygen in the XPS spectra, as well as by the 19F nmr spectra of volatile products consistent with a terminal NF2 group.
Bulk samples and thin films of polyamides (PA6 and PA12) were exposed to fluorine (1 - 10 vol.-% F2 in N2) and analysed with photoelectron (XPS) and infrared spectroscopy. Fluorination affects both, the amide and the hydrocarbon parts of the polymers. However, only the carbon atom next to the carbonyl is readily fluorinated. Chemical modification of the amide group is apparent in a large binding energy shift (+5 eV) of the N1s level and the appearance of a CO band at 1734 cm-1. It is concluded that the amide C-N bond is cleaved in the fluorination process and that COOH and NF2 end groups are formed. This conclusion is corroborated by the appearance of ester oxygen in the XPS and by the 19F NMR spectra of the volatile products that show fluorine signals chemically shifted about 200 ppm towards lower field as compared with the CHF environment.
After a delamination process in a C-fiber reinforced polymer composite, the identification of the polymer residue of poly-(phenylene sulphide) on carbon fiber surfaces gives important information on the composite failure mechanism. Using scanning force microscopy (SFM) in its lateral force imaging mode or with the stiffness imaging mode, it is almost impossible to distinguish the two composite components owing to a very low material-based contrast of the local friction and compliance. The new technique using contrast based on a local AC current measurement allows a clear identification of the conducting carbon fiber and the non-conducting polymer coverage.
Dynamic Plowing Lithography
(2001)