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Organisationseinheit der BAM
Deuterium permeation and cracking in duplex steels as viewed by ToF-SIMS and HR-SEM with data fusion
(2016)
Better understanding of hydrogen assisted degradation and trapping mecha-nisms requires sufficient imaging techniques for respective hydrogen-microstructure interaction studies, in particular with multi-phase metallic micro-structures [1]. The present work is focusing on the elucidation of deuterium be-havior in two austenitic-ferritic duplex stainless steels (DSS) under the assumption that deuterium behaves in many ways similarly to hydrogen [2]. For case studies standard 2205 and lean 2101 DSSs were chosen due to the extensive use of these steels in industry [3]. The analyses were conducted by using a novel in-situ permeation and Time-of-Flight secondary ion mass spectrometry (ToF-SIMS) imaging technique or by ex-situ ToF-SIMS imaging following electrochemical charging experiments. Another pioneering procedure was data fusion (including chemometry) of results of powerful laterally resolved chemical analysis and high resolution structural characterization techniques .
Results for the ex-situ observations showed a different influence of deuterium loading on the two steel grades as well as different damage mechanisms in each phase. Formation of sub-surface blisters between the ferrite and austenite were obtained in both the standard and the lean DSS. In both steels, an increased deuterium concentration was observed around deformed regions such as cracks, confirming that they originate from the presence of deuterium [4]. The formation of parallel cracks was obtained only in the austenite within the standard duplex whereas in the lean duplex the highest intensity of deuterium was obtained in the austenite along the ferrite-austenite interphase.
In comparison, application of the novel in-situ permeation technique enabled to register and record the deuterium permeation through the material and the respective saturation sequence of the two phases as well as the interfaces. Faster diffusion of the deuterium was observed in the ferrite and a direct proof for deuterium enrichment at the austenite-ferrite interface has been given [1]. The integration of the specified techniques gives a better insight into the processes leading to hydrogen induced failure. These two experimental techniques provide very valuable tools for elucidation of respective metallurgical failure mechanisms that can be used for the validation of respective numerical models for hydrogen assisted cracking (HAC).
The ferroelectric ceramic NBT and its solid solutions with barium titanate (BT) are examples for the most promising lead free materials to substitute the dominant Pb(Zr,Ti)O3 (PZT). Lead based material should generally be disregarded due to environmental and health reasons. However, there is no class of lead-free piezoelectric materials that can replace PZT entirely. Not only the often inferior ferroelectric properties but also the lack of understanding of the defect chemistry of NBT is still a challenge for the replacement of lead containing piezo-ceramics. Just recently it could be shown by Li et al. that NBT obtains extraordinarily high oxygen ionic conductivity when doped with Mg as acceptor. It was actually expected that doping just leads to a hardening of the ferroelectric properties. However, it became clear that the known defect chemical behavior of PZT cannot be extrapolated to NBT materials. Hence, to gain information on general doping effects a better defect chemical investigation is needed. This is particularly important for the applications with high reliability demands to investigate possible degradation and fatigue mechanisms.
In the present work Time-of-flight-secondary ion mass spectrometry (ToF-SIMS) was used in order to observe the influence of different acceptor dopants (Fe, Ni, Al) on the oxygen diffusion in NBT. ToF-SIMS holds the ability to gain a full elemental distribution in a sub-micron resolution and was therefore chosen to provide the essential information on the favorable diffusion paths of oxygen in NBT in dependence of the chosen doping element. 18O was used as a tracer for oxygen as its natural abundance is only 0.2%. The doped NBT samples have been annealed for 5 h at 500°C in a 0.2 bar 18O-tracer atmosphere to be able to detect oxygen ion diffusion. ToF-SIMS investigations were conducted on a ToF-SIMS IV (ION TOF GmbH, Münster, Germany) using a Bi+ primary ion beam (25KeV in collimated burst alignment mode with a beam diameter of ~150 nm) and a Cs+ sputter beam (3KeV).
The results illustrate the different impact of dopants on the diffusion properties which is evidence for a highly non-linear dependence on dopant type and concentration.
The ferroelectric ceramic NBT and its solid solutions with barium titanate (BT) are examples for the most promising lead free materials to substitute the dominant Pb(Zr,Ti)O3 (PZT). Lead based material should generally be disregarded due to environmental and health reasons. However, there is no class of lead-free piezoelectric materials that can replace PZT entirely. Not only the often inferior ferroelectric properties but also the lack of understanding of the defect chemistry of NBT is still a challenge for the replacement of lead containing piezo-ceramics. Just recently it could be shown by Li et al.[1] that NBT obtains extraordinarily high oxygen ionic conductivity when doped with Mg as acceptor. It was actually expected that doping just leads to a hardening of the ferroelectric properties. However, it became clear that the known defect chemical behavior of PZT cannot be extrapolated to NBT materials. Hence, to gain information on general doping effects a better defect chemical investigation is needed. This is particularly important for the applications with high reliability demands to investigate possible degradation and fatigue mechanisms.
In the present work Time-of-flight-secondary ion mass spectrometry (ToF-SIMS) was used in order to observe the influence of different acceptor dopants (Fe, Ni, Al) on the oxygen diffusion in NBT. ToF-SIMS holds the ability to gain a full elemental distribution in a sub-micron resolution and was therefore chosen to provide the essential information on the favorable diffusion paths of oxygen in NBT in dependence of the chosen doping element. 18O was used as a tracer for oxygen as its natural abundance is only 0.2%. The doped NBT samples have been annealed for 5 h at 500°C in a 0.2 bar 18O-tracer atmosphere to be able to detect oxygen ion diffusion. ToF-SIMS investigations were conducted on a ToF-SIMS IV (ION TOF GmbH, Münster, Germany) using a Bi+ primary ion beam (25KeV in collimated burst alignment mode with a beam diameter of ~150 nm) and a Cs+ sputter beam (3KeV).
The results illustrate the different impact of dopants on the diffusion properties which is evidence for a highly non-linear dependence on dopant type and concentration.
1) Li, M., et al., Nature Materials, 2014. 13(1): p. 31-35.
Among the very few techniques to localize hydrogen (H) at the microscale in steels, Time-of-flight secondary ion mass spectrometry (ToF-SIMS) was proven to be a reliable tool. The necessity to detect hydrogen stems from its deleterious effects in metals, that are often used as structural components and to obtain better understanding of the underlying metallurgical mechanisms of hydrogen embrittlement (HE) which are still unclear.
Austenitic stainless steels are nowadays commonly used in a wide variety of application, from hydrogen transport and storage facilities to petrochemical and offshore applications where they are exposed to aggressive environments and therefore prone to HE. One of the greater risks in the austenitic class is the embrittlement of the material due to the instability of the γ austenite and its transformation into a brittle α martensitic phase. This transformation takes place due to the local stresses that are induced by the uptake of hydrogen during service. Nonetheless, it was shown that this transformation can occur as an artefact during SIMS analysis itself where Cs-sputtering is necessary not only to remove surface contaminations but mainly to enhance H/D secondary ion yield.
In the following contribution we show the influence of different sputtering conditions on AISI 304L austenitic stainless steel in order to distinguish the artefact from the hydrogen induced transformation. The material was charged electrochemically in a deuterium based electrolyte. Deuterium (D) must be in these experiments as a replacement for hydrogen which cannot be used because adsorbed hydrogen superimposes hydrogen originating from charging the sample in the SIMS images. ToF-SIMS analyses were conducted by ToF SIMS IV (IONTOF GmbH, Münster, Germany). The experiments were carried out on deuterium charged and non-charged samples. The structural characterization was carried out by SEM and EBSD examinations before and after charging, both with a Leo Gemeni 1530VP field-emission scanning electron microscope and a Zeiss Supra 40 instrument (Carl Zeiss Microscopy GmbH, Oberkochen, Germany). The results showed that the use of 1keV Cs+ beam induces stacking faults while higher sputter beam energies results in γ→α transformation.