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The complexity of any microstructural characterization significantly increases when there is a need to evaluate the microstructural evolution as a function of temperature. To date, this characterization is primarily performed by undertaking elaborative ex-situ experiments where the material’s heating procedure is interrupted at different temperatures or times. Moreover, these studies are often limited to a region smaller than the representative elementary volume, which can lead to partial or even biased interpretations of the collected data. This limitation can be greatly overcome by using in-situ synchrotron X-ray refraction (SXRR). In this study, SXRR has been combined with in-situ heat treatment to monitor the porosity evolution as a function of temperature. It is shown that SXRR is a robust and straightforward method for time-resolved (3-5 min required per scan) evaluation of thermally induced microstructural changes over macroscopically relevant volumes.
The complexity of any microstructural characterization significantly increases when there is a need to evaluate the microstructural evolution as a function of temperature. To date, this characterization is primarily performed by undertaking elaborative ex-situ experiments where the material’s heating procedure is interrupted at different temperatures or times. Moreover, these studies are often limited to a region smaller than the representative elementary volume, which can lead to partial or even biased interpretations of the collected data. This limitation can be greatly overcome by using in-situ synchrotron X-ray refraction (SXRR). In this study, SXRR has been combined with in-situ heat treatment to monitor the porosity evolution as a function of temperature. This technique is a robust and straightforward method for time-resolved (3-5 min required per scan) evaluation of thermally induced microstructural changes over macroscopically relevant volumes.