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A particle roughness analysis tool, based on electron microscopy images (SEM and TEM). The influence of various parameters on the calculated roughness was also investigated: the setting of the proper threshold, accelerating voltage, etc. The samples were gradually tilted to extend imaging information of more than only one projection. Furthermore, the measurement uncertainty of the profile roughness of particles associated to various orientations was estimated.
Dual-fluorescent molecularly imprinted nanoparticles with a red-emissive carbon nanodot-doped silica core and a chlorogenic acid-imprinted fluorescent polymer layer are prepared and their use in ratiometric fluorometric analysis is described. Nanoparticle probes consisting of a shielded and stably emitting core and a shell with embedded binding sites that indicates the presence of an analyte with a change in emission allow for internally referenced measurements potentially accounting for detrimental influences from instrument drifts, light source fluctuations or sensor materials-related inhomogeneities.