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The therapy of eye tumors with fast protons is an excellent tool giving very high local control rates. At the Helmholtz-Zentrum Berlin (HZB) almost 1800 patients were treated since 1998. A 2 MV Tandetron was installed as injector for the k = 132 HZB cyclotron. Using the standard 358 duoplasmatron ion source with direct extraction of negative hydrogen ions an extremely stable proton beam can be delivered, both on the short-term and the long-term scale. The hair-needle filaments made from thoriated tungsten wires have safe operation times of more than 1000 h.
Hydrogen analysis is of particular importance in thin film technology and it is often necessary to obtain a depth profile. The method with the best depth resolution is NRA using the 6385 keV resonance of the 1H(15N,αγ)12C nuclear reaction. The correct quantification of the depth and concentration scales in the measured hydrogen profiles relies on accurate stopping power values. We present a method to deduce these values from a combination of two techniques: NRA and X-ray reflectometry (XRR). This method is applied to the determination of the stopping power of ~6.4 MeV 15N ions in H-containing amorphous Si-layers (a-Si:H). Density-independent stopping powers at different H concentrations are determined by combining the results from NRA and XRR with an overall uncertainty of 3.3%, showing good agreement with SRIM values. This work shows exemplary the methodology for future evaluation of stopping powers for quality assurance in NRA.
Several glazed ceramic fragments (XVIth to XVIIIth centuries) from two production centers in Portugal (Coimbra and Lisbon) were the object of this study. The ones from Coimbra comprise two sets of samples: faiences and tiles. The ones from Lisbon are only tiles (azulejos, in Portuguese). The three main divisions of such pieces are the ceramic support (body), glaze and surface decoration. The system decoration/glaze is not easy to investigate, due to the high heterogeneity resulting from the mixing procedures and firing temperatures used. Moreover, the ability of the pigment to diffuse into the base glaze varies depending on the composition of both the pigment and the glaze in terms of fusibility. In order to raster these effects, high resolution techniques are required. In this work, synchrotron micro-X-ray fluorescence (µ-XRF) analysis was performed to monitor the profiles of the characteristic elements from the colors used and the glaze in well prepared cross-sections of the samples. Key elements are: Co for blue, Mn for purple, Cu for green, Sb for yellow, Pb for the glaze and Fe for the body. The major difference observed is that faiences have glaze thicknesses between 150 and 200 µm and tiles have glaze thicknesses between 350 and 400 µm. Furthermore, in faiences all the pigments except the yellow ones are well dispersed into the glassy matrix, while in tiles, all of them are just partially diffused throughout the glaze. However, differences between the tiles from Coimbra and Lisbon were observed. In the samples from Lisbon, a higher intake from the pigment throughout the glaze is observed.
A study regarding the possibility to use compound refractive lenses (CRLs) for X-ray absorption spectroscopy (XAS) was conducted. For XAS measurements the energy of the monochromatic incident beam has to be tuned over an energy range which is broader than the energy bandwidth of a CRL. To prove that µ-XAS with compound refractive lenses is possible, it had to be investigated how changes in the energy influence the beam parameters. This was done by tuning the energy around the nominal energy of the lens and recording images with a high resolution X-ray imaging setup. To investigate the changes in the spot size the scintillator was placed at the nominal focal distance and scans along the beam axis were performed. The effect on the photon flux of the incident beam due to absorption in the lens was investigated by performing XANES measurement on different reference materials with and without CRL. The results of these measurements using a CRL designed for 9 keV are shown and discussed.
We report on the trace analysis of copper and iron impurities in multicrystalline silicon wafers with the microbeam X-ray fluorescence (µ-XRF) technique. The efficiency of solar cells, which are based on multicrystalline silicon wafers, is strongly influenced by minor contamination with metals such as copper and iron. Application of compound refractive lenses (CRLs) in µ-XRF allows versatile two-dimensional mapping of relevant contaminations and localization of their sites of deposition. In this context, the measured bulk average limit of detection (LOD) was one picogram of iron and copper per gram of silicon. We suggest that µ-XRF is a valuable tool for non-destructive spatial (3D) quantification of metal impurities in a wide range of materials and devices whose functioning could be critically affected by impurities.