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The publicly available document encapsulates the first version of the Catalogue of Services of the future EC4Safenano Centre (CoS 2019).
The CoS 2019 is structured in 12 Service Categories and 27 Service Topics, for each of the 12 categories considered. This architecture configures a 12 x 27 matrix that allows ordering the potential EC4Safenano offer in 324 types of services/groups of services.
Each type of service/group of services is described, in a simple and friendly way, by means of a specific service sheet: the EC4Safenano - Service Data Sheet (EC4-SDS). These EC4-SDSs allow structuring and summarizing the information of each service, providing the customer with a concise view of characteristics of the service and also the contact details with the service provider.
The CoS 2019 deploys a map of services consisting of a set of 100 EC4-SDSs, covering 7 of the 12 Service Categories and 17 of the 27 Service Topics.
The harmonization of services is visualized as a future necessary step in EC4Safenano, in order to strengthen the offer and provide added value to customers with a growing offer of harmonized services in future versions of the CoS.
The information contained in this document is structured in 3 main sections, as follows:
• Catalogue structure. This section describes in short the main characteristics of the CoS 2019.
• Catalogue content. This section represents the core part of the document and encapsulates the set of 100 SDSs displaying the offer proposed by the CoS 2019.
• Online Catalogue. This section describes the resources implemented by EC4Safenano to facilitate the on-line consultation of the CoS 2019 by customers and other interested parties.
The wide use of nanoforms with at least one dimension below 100 nm in our daily life requires a detailed knowledge of their physicochemical properties which are needed for risk assessment or quality control. Therefore, a comprehensive characterization of these properties was considered as relevant including: chemical composition, crystallinity, particle size, particle shape, surface chemistry, and specific surface area (SSA).
We want to discuss, how Scanning Electron Microscopy (SEM), Electron Probe Microanalysis (EPMA) in the version with energy dispersive X-ray spectroscopy (EDS), Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and X-ray Photoelectron Spectroscopy (XPS) can contribute to gain comprehensive insights into the nature of the nanoparticles. SEM results provide the particle size and shape (distribution). A quick identification of the main chemical elements present in the sample can be obtained with EDS, whereas XPS allows a more detailed chemical identification of the small nanoparticles below 20 nm or of the near-surface region of larger particles. ToF-SIMS is even much more surface-sensitive and leads to a deeper understanding of the surface chemistry of the nanoparticles. As exemplary samples, two Al-coated TiO2 samples in nanopowder form were chosen from the JRC repository, capped either with a hydrophilic or a hydrophobic organic shell.
A focus of our case study was to show, how reliable, reproducible and traceable data can be obtained. Therefore, each step in the workflow of sample investigation must be described in detail. For the most of these steps, well-established standards are available. Usually, the conditions of the particular measurements with each analysis method are saved as meta-data in the common file formats. But other factors like sample preparation and data reduction approaches may influence the result of the investigations in a significant manner and must be described often in a separate file (as a protocol) together with the data file. For sensitive materials like nanoobjects, the preparation of the sample influences the results crucially, e.g. measured as suspension or as powders. Furthermore, data reduction like selection of relevant peaks in spectra or particles in images, background subtraction, peak deconvolution, models for the quantification of the spectra must be considered in the interpretation of the results ideally with associated individual measurement uncertainties. Only a detailed description of all these factors allows to obtain a comprehensive characterization with reliable, reproduceable and traceable data. Examples of standardized procedures of measurement or on data reduction will be highlighted.
We thank for the funding from the European Unions’s Horizon 2020 for the project NanoSolveIt (grant agreement No. 814572) and for the project NANORIGO (grant agreement No. 814530).
(1) First results show the suitability of IL as reference for quantification of XPS (at least for organic materials).
(2) Different quantification methods lead to similar results (with a slight advantage for “background method”).
(3)Promising reference material for a better understanding and traceable protocols for the quantification of organic materials with XPS.
Controlling the thickness and tightness of surface passivation shells is crucial for many applications of core-shell nanoparticles (NP). Usually, to determine shell thickness, core and core/shell particle are measured individually requiring the availability of both nanoobjects. This is often not fulfilled for functional nanomaterials such as many photoluminescent semiconductor quantum dots (QD) used for bioimaging, solid state lighting, and display technologies as the core does not show the application-relevant functionality like a high photoluminescence (PL) quantum yield. This calls for a whole nanoobject approach. Moreover, the thickness of the organic coating remains often unclear.
By combining high-resolution transmission electron microscopy (HR-TEM) and X-ray photoelectron spectroscopy (XPS), a novel whole nanoobject approach is developed representatively for an ultrabright oleic acid-stabilized, thick shell CdSe/CdS QD with a PL quantum yield close to unity. The size of this spectroscopically assessed QD, is in the range of the information depth of usual laboratory XPS. Information on particle size and monodispersity were validated with dynamic light scattering (DLS) and small angle X-ray scattering (SAXS) and compared to data derived from optical measurements. The results of the different methods match very well within the different measurement uncertainties. Additionally, results obtained with energy-resolved XPS using excitation energies between 200 eV and 800 eV are discussed with respect to a potential core/shell intermixing.
Moreover, the future application potential of this approach correlating different sizing and structural methods is discussed considering the method-inherent uncertainties and other core/multi-shell nanostructures.