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Nanoforms with at least one dimension below 100 nm have an important part to play in more and more areas of our daily life. Therefore, risk assessment of these materials is becoming increasingly important. In this context, the European Chemical Agency (ECHA) considered eleven physico-chemical properties as relevant, of which the following six are essential for the registration: chemical composition, crystallinity, particle size, particle shape, surface chemistry and specific surface area. Four of these priority properties can be obtained with electron microscopy and surface analytics like XPS and ToF-SIMS. The reliability of this data must be ensured, especially for their use for grouping and read across approaches. On the other hand, the “reproducibility” crisis has revealed major shortcomings in the reliability of published data.
In a case study, we show how the quality of the data can be ensured by using existing standards and protocols of each step in the workflow of sample characterization. As exemplary samples, two Al-coated TiO2 samples as nanopowders were selected from the JRC repository, capped either with a hydrophilic or a hydrophobic organic ultrathin shell. SEM results provided the size and shape of the nanoparticles, a first overview about the composition was obtained with EDS. XPS and ToF-SIMS supplied the surface chemistry, especially information about the shell and the coating of the particles. Standards and protocols of all steps of the analytical workflow including preparation and data reduction are discussed regarding reliable and reproducible data. Additionally, uncertainties for the different steps are specified.
Only such a detailed description of all these factors allows a comprehensive physico-chemical characterization of the nanoparticles with understanding of their potential risk assessment.
XPS of GR2M
(2022)
VAMAS-Enabling international standardisation for increasing the take up of Emerging Materials
(2022)
VAMAS (Versailles Project on Advanced Materials and Standards) supports world trade in products dependent on advanced materials technologies by providing technical basis for harmonized measurements, testing, specification, reference materials and standards. The major tools for fulfilling this task are interlaboratory comparisons (ILC). The organisation structure of VAMAS is presented. It is discussed, how a new technical activity can initiate.
Colours, nano and surface
(2022)
The basic ideas of colours and pigments are presented. The correlation between nanomaterials and colours are explained. Different methods are presented for investigating nanoparticles and their surface. At the end a case study is presented explaining the importance of coating for the properties of nanoparticles.
The Competence Centre nano@BAM is presenting a new X-ray Photoelectron Spectrometer – the HAXPES (XPS at hard energy) – for researching advanced materials at the nanoscale. With HAXPES detailed chemical information can now be gained not only from the first outermost nanometres of the sample surface, but also from deeper regions.
Top international experts will share their knowledge and key findings on how to utilise HAXPES for exploring the surface of various advanced materials. Following the lectures, we will show you a short demo of the new instrument and answer your questions.
The wide use of nanoforms with at least one dimension below 100 nm in our daily life requires a detailed knowledge of their physicochemical properties which are needed for risk assessment or quality control. Therefore, a comprehensive characterization of these properties was considered as relevant including: chemical composition, crystallinity, particle size, particle shape, surface chemistry, and specific surface area (SSA).
We want to discuss, how Scanning Electron Microscopy (SEM), Electron Probe Microanalysis (EPMA) in the version with energy dispersive X-ray spectroscopy (EDS), Time-of-Flight Secondary Ion Mass Spectrometry (ToF-SIMS) and X-ray Photoelectron Spectroscopy (XPS) can contribute to gain comprehensive insights into the nature of the nanoparticles. SEM results provide the particle size and shape (distribution). A quick identification of the main chemical elements present in the sample can be obtained with EDS, whereas XPS allows a more detailed chemical identification of the small nanoparticles below 20 nm or of the near-surface region of larger particles. ToF-SIMS is even much more surface-sensitive and leads to a deeper understanding of the surface chemistry of the nanoparticles. As exemplary samples, two Al-coated TiO2 samples in nanopowder form were chosen from the JRC repository, capped either with a hydrophilic or a hydrophobic organic shell.
A focus of our case study was to show, how reliable, reproducible and traceable data can be obtained. Therefore, each step in the workflow of sample investigation must be described in detail. For the most of these steps, well-established standards are available. Usually, the conditions of the particular measurements with each analysis method are saved as meta-data in the common file formats. But other factors like sample preparation and data reduction approaches may influence the result of the investigations in a significant manner and must be described often in a separate file (as a protocol) together with the data file. For sensitive materials like nanoobjects, the preparation of the sample influences the results crucially, e.g. measured as suspension or as powders. Furthermore, data reduction like selection of relevant peaks in spectra or particles in images, background subtraction, peak deconvolution, models for the quantification of the spectra must be considered in the interpretation of the results ideally with associated individual measurement uncertainties. Only a detailed description of all these factors allows to obtain a comprehensive characterization with reliable, reproduceable and traceable data. Examples of standardized procedures of measurement or on data reduction will be highlighted.
We thank for the funding from the European Unions’s Horizon 2020 for the project NanoSolveIt (grant agreement No. 814572) and for the project NANORIGO (grant agreement No. 814530).
(1) First results show the suitability of IL as reference for quantification of XPS (at least for organic materials).
(2) Different quantification methods lead to similar results (with a slight advantage for “background method”).
(3)Promising reference material for a better understanding and traceable protocols for the quantification of organic materials with XPS.