Filtern
Dokumenttyp
- Zeitschriftenartikel (18)
- Vortrag (15)
- Posterpräsentation (14)
- Dissertation (1)
Schlagworte
- XRF (7)
- EDS (6)
- SEM (6)
- EDX (4)
- Modelling (3)
- X-ray scattering (3)
- Acceptance area (2)
- Calibration (2)
- FWHM (2)
- Focal distance (2)
Eingeladener Vortrag
- nein (15)
Determination of the efficiency of an energy dispersive X-ray spectrometer up to 50 keV with a SEM
(2009)
Both electron and polychromatic photon excitations (micro-focus X-ray source) at a scanning electron microscope (SEM) are used to determine the efficiency of an energy dispersive X-ray spectrometer up to 50 keV by means of a calibrated X-ray spectrometer and reference materials (RM) specially selected for this purpose.