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In our (dramatically understaffed) X-ray scattering laboratory, developing a systematic, holistic methodology1 let us provide scattering and diffraction information for more than 2100 samples for 200+ projects led by 120+ collaborators over the last five years. Combined with universal, automat-ed data correction pipelines, as well as our analysis and simulation software, this led to more than 40 papers2 in the last 5 years with just over 2 full-time staff members.
While this approach greatly improved the consistency of the results, the consistency of the samples and sample series provided by the users was less reliable nor necessarily reproducible. To address this issue, we built an EPICS-controlled, modular synthesis platform to add to our laboratory. To date, this has prepared over 1200 additional (Metal-Organic Framework) samples for us to meas-ure, analyse and catalogue. By virtue of the automation, the synthesis of these samples is automat-ically documented in excruciating detail, preparing them for upload and exploitation in large-scale materials databases alongside the morphological results obtained from the automated X-ray scat-tering analysis.
Having developed these proof-of-concepts, we find that the consistency of results are greatly im-proved by virtue of their reproducibility, hopefully adding to the reliability of the scientific findings as well. Additionally, the nature of the experiments has changed greatly, with much more emphasis on preparation and careful planning. This talk will discuss the advantages and disadvantages of this highly integrated approach and will touch upon upcoming developments.
A brief introduction is given into our data collection and organization procedure, and why we have settled on the HDF5-based NeXus format for describing experimental data.
The links between NeXus and the SciCat data catalog is also provided, showing how the NeXus metadata is automatically added as searchable metadata in the catalog.
A brief introduction to the efforts we have done in our lab towards AI/ML analysis of SAXS data. For this, we need to extend the data with an extensive, structured hierarchy of metadata and associated data. A practical look into the information stored in our files, and the organization of the files in a data catalog is presented.
In contrast to the crisp, clear images you can get from electron microscopy, small-angle X-ray scattering (SAXS) patterns are rather featureless. These patterns, however, contain averaged structural information of all of the finest material structures that were illuminated by the X-ray beam. With careful and precise investigation, and supplementary information from complementary techniques, this bulk material structure can be quantified to reveal structural information spanning four or even five decades in size. Additionally, while the data correction and analysis is complex, sample preparation is very straightforward, also allowing for in-situ and operando measurements to be performed without breaking a sweat. In the right hands, then, this technique can be the most powerful tool in your analytical arsenal.
Today's speaker is a young scientist whose research on all aspects of small-angle scattering has taken him from his birthplace in Netherlands, to Denmark, Japan and now Germany. His research has led to a new method and software for scattering pattern analysis, a comprehensive set of data corrections together with the Diamond Light Source, and a new ultra-SAXS plug-in instrument.
For the last few years, he has been working on a comprehensive and universal methodology to get high-quality X-ray scattering measurements for any sample, using his new instrument at the institute. This instrument has now been heavily modified both in hardware and software, so that it can deliver better data.
These developments are always driven by interesting collaborations with materials researchers and other scientists. As a joint member he has published works on a wide variety of materials, including self-assembled structures in liquids, composite materials and porous carbon catalysts.
He has also been very active in outreach, for example by co-organizing an online lecture series called ‘#the Light Stuff’ on scattering and diffraction, running the ‘looking at nothing’ weblog, hosting a yearly introductory scattering course, and he has many scattering-related lectures available on YouTube.
Our distinguished speaker is Dr. Brian Richard Pauw from the Federal Institute for Materials Research and Testing in Germany. I proudly invite Dr. Pauw to begin his talk
Today's speaker is a young scientist whose research on all aspects of small-angle scattering has taken him from his birthplace in Netherlands, to Denmark, Japan and now Germany. His research has led to a new method and software for scattering pattern analysis, a comprehensive set of data corrections together with the Diamond Light Source, and a new ultra-SAXS plug-in instrument.
For the last few years, he has been working on a comprehensive and universal methodology to get high-quality X-ray scattering measurements for any sample, using his new instrument at the institute. This instrument has now been heavily modified both in hardware and software, so that it can deliver better data.
These developments are always driven by interesting collaborations with materials researchers and other scientists. As a joint member he has published works on a wide variety of materials, including self-assembled structures in liquids, composite materials and porous carbon catalysts.
He has also been very active in outreach, for example by co-organizing an online lecture series called ‘#the Light Stuff’ on scattering and diffraction, running the ‘looking at nothing’ weblog, hosting a yearly introductory scattering course, and he has many scattering-related lectures available on YouTube.
Our distinguished speaker is Dr. Brian Richard Pauw from the Federal Institute for Materials Research and Testing in Germany. I proudly invite Dr. Pauw to begin his talk.
Excelling in brevity but lacking in applicability, the 2011 EU nanomaterial definition has become a source of anguish for scientists and industry alike. Repeated pleas and discussions with our own envoy have demonstrated the strength of their resolve: this definition is unlikely to change. Manufacturers of many materials (cosmetics, pigments, foodstuffs, etc.) will have to characterise and label all their products accordingly, a task still impossible for lack of a clear metrological approach towards this goal. Therefore, the onus has fallen on the scientists to come up with a practicable measurement technique allowing inexpensive classification covering large swathes of the material landscape. Small-angle X-ray Scattering (SAXS) probes the size range in question, and can - with due care - deliver a bulk-averaged volume-weighted size distribution. Like any other real-world measurement method, however, it is not (and can never be) a universal solution. This presentation will clarify the SAXS technique, provide several application examples for nanomaterial characterisation, and will detail the limitations and pitfalls that accompany its abilities. At the end of this presentation, you will have the information to judge whether the technique is amenable to your materials or not.
In our (dramatically understaffed) X-ray scattering laboratory, developing a systematic, holistic methodology let us provide scattering and diffraction information for more than 2100 samples for 200+ projects led by 120+ collaborators. Combined with automated data correction pipelines, and our analysis and simulation software, this led to more than 40 papers in the last 5 years with just over 2 full-time staff members.
This year, our new, modular synthesis platform has made more than 1000 additional samples for us to analyse and catalogue. By virtue of the automation, the synthesis of these samples is automatically documented in excruciating detail, preparing them for upload and exploitation in large-scale materials databases.
This talk is intended to spark ideas and invite collaborations by providing an overview of: 1) the current improvements in our wide-range X-ray scattering laboratory methodology, and 2) introducing our open, modular robotic platform for systematic sample preparation.