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Excelling in brevity but lacking in applicability, the 2011 EU nanomaterial definition has become a source of anguish for scientists and industry alike. Repeated pleas and discussions with our own envoy have demonstrated the strength of their resolve: this definition is unlikely to change. Manufacturers of many materials (cosmetics, pigments, foodstuffs, etc.) will have to characterise and label all their products accordingly, a task still impossible for lack of a clear metrological approach towards this goal. Therefore, the onus has fallen on the scientists to come up with a practicable measurement technique allowing inexpensive classification covering large swathes of the material landscape. Small-angle X-ray Scattering (SAXS) probes the size range in question, and can - with due care - deliver a bulk-averaged volume-weighted size distribution. Like any other real-world measurement method, however, it is not (and can never be) a universal solution. This presentation will clarify the SAXS technique, provide several application examples for nanomaterial characterisation, and will detail the limitations and pitfalls that accompany its abilities. At the end of this presentation, you will have the information to judge whether the technique is amenable to your materials or not.
This talk highlights a proof-of-concept that demonstrates the ability to calculate high-resolution Fourier transforms. These can be combined with multi-scale modeling to simulate scattering over a wide range, from small-angle scattering to XRD and PDF.
The preprint documenting this is available on the ArXiv here:
https://doi.org/10.48550/arXiv.2303.13435
The Jupyter notebook, VASP calculation details and MOUSE measured scattering patterns are available from this Zenodo repository: https://dx.doi.org/10.5281/zenodo.7764045