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Eingeladener Vortrag
- nein (3)
Deciphering the sulfate attack of cementitious materials by high-resolution micro-x-ray diffraction
(2011)
The durability of cementitious materials depends, among others, on their resistance against chemical attack during the service life of a building. Here, we present an approach to analyze changes in the phase composition due to chemical attack in the form of sulfate ingress within the microstructure. Micro-X-ray (µX-ray) diffraction using synchrotron radiation in Debye–Scherrer (transmission) geometry allowed a spatial resolution of 10 µm. Phase transformations in the wake of damaging processes were observed in a detailed high-resolution imaging study. In comparison, samples containing supplementary cementitious materials were investigated and used to reconstruct the influence of different degeneration processes in detail. Additionally, reaction fronts within the bulk were localized by micro-X-ray fluorescence analysis. The experimental setup provided the possibility for analyzing the phase assemblage of a given sample without destroying the microstructure. The specimens for phase analysis are thick sections of the primary material and can be used for further microscopic analysis of the microstructure and microchemistry, e.g., scanning electron microscopy–energy-dispersive X-ray spectroscopy (SEM–EDX) or Raman spectroscopy.
The results of investigations on the emission of particulate matter from three outdoor firework displays are presented. During these events, possibly harmful and toxic aerosol emissions were measured. Aerosols in the size range from 30 to 450 nm were detected. The maxima in the observed particle size distribution were between 80 and 175 nm, and the highest value determined was ~1.3 · 106 particles per cm³, while the highest mass concentration was approximately 1.8 mg m–3. The time-averaged particle mass concentration did, however, not exceed 0.7 mg m–3 (over 15 min).
Molecular masses and end groups of polystyrene (PS) formed in a novel container-less polymerization strategy, based on levitated droplets in an acoustic trap, were determined by Gel Permeation Chromatography (GPC) and Matrix-assisted Laser Desorption/Ionization Time of Flight Mass spectrometry (MALDI-TOF MS).
A new setup for fast spatially resolved measurements of elemental trace amounts under total reflection conditions using a new colour X-ray camera is described. Samples prepared on conventional total reflection X-ray fluorescence (TXRF) reflectors were measured at BESSY II synchrotron. A spatial resolution of 50 × 50 µm² was obtained, while the required time for the investigation of a 10 × 10 mm² sample is 30 seconds. The set-up is up to 350 times faster than conventional X-ray fluorescence systems for elemental traces. The major components of the X-ray camera are polycapillary optics and a pn-CCD chip with an active area of 13 × 13 mm². This area is divided into 264 × 264 pixels of 48 × 48 µm². A full X-ray spectrum with a resolution of 152 eV @ 5.9 keV and a chip temperature of 246 K is recorded for each pixel. The chip has a read-out rate of 400 Hz.