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The determination of O, N and H using a microwave induced plasma coupled to carrier gas hot extraction was exploratory investigated. The signal intensities versus time of blanks and calibration materials were recorded. To check for interferences the signal intensities versus wavelength were recorded at the times just before increase and at the maximum of the time dependent analytical signal. O, N and H were investigated at their prominent wavelengths of 777 nm, 174 nm and 486 nm, respectively. Calibration was performed for O, N and H in the ranges of 027 µg, 351000 µg and 343 µg respectively. For concentration values in the middle of the linear part of the investigated calibration interval, a relative precision of 5% at 13 µg, 2% at 74 µg and 0.6% at 23 µg for O, N and H respectively was found. The maximum matrix load to the plasma used was found to be 150 µg min-1. From the signal to noise ratio and the sensitivity obtained, instrumental limits of detection (3s) of 0.01 µg for O, 1 µg for N and 0.1 µg for H were found. Assuming a typical sample mass of 1 g this corresponds to relative LODs of 0.01 µg g-1, 1 µg g-1 and 0.1 µg g-1 for O, N and H respectively.
An inter-laboratory study was performed by some National Metrology Institutes in order to take a snap shot of the comparability and the capability of performing purity assessments of high purity materials as needed for providing national standards for elemental determination. The measurand was defined as the value of the sum of the mass fractions of Ag, Al, Cu, Fe, Pb and Zn in the bulk of a high purity nickel material and the interim results for the six individual impurities. Whereas for the analytes Ag, Al, Cu and Fe there was no agreement within the target uncertainty of 30%, agreement could be achieved for Pb and Zn. The discrepancies observed for the individual analytes resulted in a variation of a factor of 8 of the reported values for the impurity of nickel with respect to the six defined metallic analytes. The reference measurements using IDMS and for Al using GD-MS confirmed the lower reported values.
The application of metrology in chemical analysis is today hampered by psychological and practical barriers. The argumentation is based on the differences in physical and chemical metrology, which arises mainly from the objects of the measurements. The term measurement is discussed in the realm of analytical chemistry with a special focus on the inherent relation between chemical identification and determination as well as the consequent use of the concept of traceability and uncertainty.
The capabilities of National Metrology Institutes (NMIs) and selected outside expert laboratories of determining the mass fractions of the main and minor elements Cu, Pb, Sn, Fe, and Ni in a lead-containing brass were assessed. This pilot study P76 was organized as an activity of the Inorganic Analysis Working Group of CCQM and was piloted by the Federal Institute for Materials Research and Testing (BAM). In total 12 laboratories (four NMIs and eight outside labs) submitted results, some of them more than one set of results per element. The laboratories were free to choose any analytical method they wanted to use for the analysis. Consequently various methods of measurement were employed: inductively coupled plasma optical emission spectrometry (ICPOES), inductively coupled plasma mass spectrometry (ICPMS), instrumental neutron-activation analysis (INAA), titrimetry, flame atomic-absorption spectrometry (FAAS), spectrophotometry (MAS), electrogravimetry, and gravimetric analysis. After testing for homogeneity within BAM, a certified reference material of lead-containing brass was used as test sample without informing the participants about the source of the material. The agreement of the results for all elements investigated was acceptable and mean values calculated from the results of all participants were close to the certified mass fractions of the CRM used as test sample. No statistically significant differences between the results of the NMIs and those of the non-NMIs could be observed.
The International Temperature Scale of 1990 (ITS-90) is based on thermodynamic equilibrium states of ideally pure substances. The largest contribution to the uncertainty budgets of most metallic fixed points is the influence of impurities on the fixed-point temperature. Therefore, a traceable chemical analysis of the remaining impurities with small uncertainty is the basis of further progress. Further requirements are better knowledge of the phase diagrams at very low impurity contents, impurity segregation, and the quantification and correction of thermal effects during a fixed-point realization. In this article, current and future activities at PTB and BAM in order to develop improved metallic fixed-point cells of the ITS-90 are reviewed.