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Carbon nanomembranes are synthetic two-dimensional sheets with nanometer thickness, macroscopic lateral dimensions, and high structural homogeneity. They have great application potential in various branches of nanotechnology. Because of their full carbon structure, it is not clear whether macromolecules like poly(methyl methacrylate) (PMMA) can be irreversibly adsorbed on their surface. Here, irreversible adsorption means that the polymer chains cannot be removed by a leaching process, which is assumed in technological transfer processes. However, if polar defects are present on the carbon nanomembranes (CNMs), it may occur that polymers can be irreversibly adsorbed. To address this question, PMMA was spin-coated on top of CNMs, annealed for a specific time at different temperatures, and then tried to be removed by a acetone treatment in a leaching approach. The samples were investigated in detail by atomic force microscopy, X-ray photoelectron spectroscopy, and broadband dielectric spectroscopy, where the latter method has been applied to CNMs for the first time. Unambiguously, it was shown that PMMA can be adsorbed on the surface of CNMs after annealing the sample above the glasstransition temperature of PMMA. The general occurrence of polar defects on the surface of CNMs and the adsorption of polymers open opportunities for advanced innovative hybrid materials combining the properties of the CNM with those of the polymer.
The composition of the surface layer in dependence from the distance of the polymer/air interface in thin films with thicknesses below 100 nm of miscible polymer blends in a spatial region of a few nanometers is not investigated completely. Here, thin films of the blend poly vinyl methyl ether) (PVME)/polystyrene (PS) with a composition of 25/75 wt% are investigated by Energy Resolved X-ray Photoelectron Spectroscopy (ER-XPS) at a synchrotron storage ring using excitation energies lower than 1 keV. By changing the energy of the photons the information depth is varied in the range from ca. 1 nm to 10 nm. Therefore, the PVME concentration could be estimated in dependence from the distance of the polymer/air interface for film thicknesses below 100 nm. Firstly, as expected for increasing information depth the PVME concentration decreases. Secondly, it was found that the PVME concentration at the surface has a complicated dependence on the film thickness. It increases with decreasing film thickness until 30 nm where a maximum is reached. For smaller film thicknesses the PVME concentration decreases. A simplified layer model is used to calculate the effective PVME concentration in the different spatial regions of the surface layer.
In the course of miniaturizing modern technology down to the molecular scale, much remain unknown about the materials behavior and the deviations from the bulk that might arises from confinement effects. Here, a combination of nano-sized relaxation spectroscopies (Broadband dielectric spectroscopy (BDS) and Specific heat spectroscopy (SHS); employing AC nanochip calorimetry) were utilized to investigate the glassy dynamics of ultra-thin films of Poly (vinyl methyl ether) (PVME) and of blends PVME / Polystyrene (PS) 50:50 wt-%,, which are miscible in bulk (thicknesses: ca. 8 nm – 160 nm, film thickness was controlled by ellipsometry, film topography by AFM). Both methods are sensitive to different probes; where SHS senses entropy fluctuations while BDS measures dipole fluctuations. For BDS measurements, a recently developed nano-structured electrode sample arrangement is employed, where ultra-thin films are spin-coated on an ultra-flat highly conductive silicon wafer, sandwiched between a wafer with nanostructured SiO2 nano-spacers with heights between 35 nm and 70 nm. For PVME films, two thickness independent processes were observed and interpreted to be the α-processes of a bulk-like layer and a process due to an absorbed layer to the substrate. This adsorbed layer further undergoes a confinement effect that results in the localization of the segmental dynamics, which results in an Arrhenius-like temperature dependence. A detailed analysis of the dielectric strengths of both processes reveals that the thickness of the adsorbed layer decreases with increasing temperature, while that of the bulk-like layer increases. For the blend system, by measuring the dynamic Tg in dependence of the film thickness, SHS showed that the Tg of the whole film was strongly influenced by a nanometer-thick surface layer at the polymer/air interface due to a self-assembling process. The dynamic Tg obtained from the SHS measurements decreased with decreasing film thickness. On the other hand, BDS measurements showed a completely different behavior. At high temperatures, the temperature dependence of the relaxation times of the films follows that of bulk-like PS/PVME; obeying the VFT-law. With decreasing temperature, the temperature dependence deviates from the VFT to an Arrhenius law; where the apparent activation energy decreases with decreasing film thickness. This is the first example where confinement induced changes were observed by BDS for ultra-thin films. All results were analyzed in detail in a comprehensive discussion.
Multilayer carbon nanomembrances (CNMs) could pave the way for a new ultrathin functional conductive coatings with tunable electrical, optical, and chemical properties. Due to their molecular thickness, they can also be regarded as “interfaces without bulk” separating regions of different gaseous, liquid, or solid components and controlling the materials exchange between them, making them optimal materials for membranes applications. Furthermore, their physical and chemical properties depend strongly on their structure, molecular composition, and the surroundings of either sides, thus allowing for tailored properties. Here, nanolayers of Aromatic p-terphenylthiol (TPT) self-assembled into 2D carbon monolayers (thickness - 1.6 nm) were synthesized and further crosslinked by ion bombardment, forming CNMs. Here, though a recently developed multilayer nanosheets routine, stacks of 5, 10, 15 and 20 TPT sheets where transferred on top of each other forming a multilayered CNMs. However, this transfer routine could introduce some intrinsic defects to the sheets, which would alter the molecular composition and / or structure, thus consequently the CNMs properties. Therefore, it is essential to characterize defects in “pure” TPT nanomembranes, before tailoring the molecular compositions, e.g. adding functional groups. For this reason, broadband dielectric spectroscopy (BDS) was utilized to characterize any defects that could be rasied during preparation. Due the structure of pure TPT membranes, no dipole moment should exsist. However, the presence of other elements, e.g. water or sulphur, would result in a dipole moment that could be probed by BDS.
As a main result, for all different stacked-layer numbers, a clear relaxation process is seen, which moves to higher frequencies with increasing the temperature. The temperature dependence of the relaxation rate of this process is independent of film thickness and can be well described by a common VFT function, hence a corporative motion. This relaxation process was assigned to intrinisic defects in the membranes, introduced during preparation, which was further confimed by a detailed anaylsis of the dielectric strength. This is the first BDS measurment on TPT CNMs.
Despite the many controversial discussions about the nanometric confinement effect on the properties of ultra-thin films, much remain not understood and/or experimentally unproven. Here, a combination of Broadband Dielectric Spectroscopy (BDS) and Specific Heat Spectroscopy (SHS) employing AC nanochip calorimetry were utilized to investigate the glassy dynamics of ultra-thin films of a low MW Poly (vinyl methyl ether) (PVME) (thicknesses: 7 nm – 160 nm). For BDS measurements, a recently developed nano-structured electrode sample arrangement is employed; where ultra-thin films are spin-coated on an ultra-flat highly conductive silicon wafer, sandwiched between a wafer with nanostructured SiO2 nano-spacers with heights between 35 nm and 70 nm. For films with thicknesses up to 50 nm, BDS measurements showed two relaxation processes, which can be analyzed for these film thicknesses in details. The process located at higher frequencies coincidence in both, its position and temperature dependence, with the -relaxation of bulk PVME and is therefore assigned to the -relaxation of a bulk-like layer. The temperature dependence of the relaxation rate of this process in independent of film thickness. This is further confirmed by the SHS investigations, which superimpose in its temperature dependence with the BDS results; independent of film thickness. The second process is located at lower frequencies, where it shows a different temperature dependence and ascribed to the relaxation of polymer segments adsorbed at the substrate. The interaction of PVME with SiO2 was further confirmed by contact angle investigations. This adsorbed layer further undergoes a confinement effect that results in a lower Vogel temperature than that of the bulk-like layer. A detailed analysis of the dielectric strengths of both processes reveals that the thickness of the adsorbed layer decreases with increasing temperature, while that of the bulk-like layer increases. As a main conclusion, BDS showed that the glassy dynamics of the bulk-like and the adsorbed layer are thickness independent, which is in agreement with the SHS results. To our knowledge, this is the first probing of the segmental dynamics of an adsorbed layer in ultrathin films.
The glass transition behavior of ultra-thin supported polymer films is discussed controversially in the literature for around 20 years. Substantial efforts have been archived to understand it. In this contribution, a combination of methods sensitive to bulk properties of a system, like dielectric or specific heat spectroscopy with surface analytics, for instance, atomic force microscopy (AFM), contact angle measurements, and X-ray photoelectron spectroscopy (XPS) were employed to study the glass transition of ultra-thin supported films. All investigations were carried out on identically prepared and treated samples. Different systems with different complexities going from more or less flexible homopolymers over rigid main chain macromolecules to polymer blends have been studied. For the investigated flexible macromolecules, the dynamic glass transition temperature estimated within the frame of the linear response approach is independent of the film thickness down to several nanometers and identical to the bulk value. For polystyrene it was found the thermal glass transition temperatures can depend on the film thickness. This different behavior is not well understood till now and needs further experimental clarification. For the investigated main chain polymers polycarbonate and polysulfone. Dynamic and thermal glass transition temperature estimated from the dielectric measurements increases with decreasing film thickness. This is discussed in the frame of a strong interaction of the polymer segments with the surface of the substrate. In general for homopolymers, the interaction energy of the polymer segments with the substrate surface cannot be considered as the only parameter, which is responsible for the change in the thermal glass transition with the film thickness. For the investigated miscible blend system of polystyrene/poly(vinyl methyl ether) at a composition of 50/50 wt-% a decrease of the dynamic glass transition temperature with decreasing film thickness is found. This is explained by the formation of a poly(vinyl methyl ether)-rich surface layer with a higher molecular mobility.
In the course of miniaturizing modern technology down to the molecular scale, much remain unknown about the materials behavior and the deviations from the bulk that might arises from confinement effects. Here, a combination of nano-sized relaxation spectroscopies (Broadband dielectric spectroscopy (BDS) and Specific heat spectroscopy (SHS); employing AC nanochip calorimetry) were utilized to investigate the glassy dynamics of ultra-thin films of Poly (vinyl methyl ether) (PVME) and of blends PVME / Polystyrene (PS) 50:50 wt-%,, which are miscible in bulk (thicknesses: ca. 8 nm – 160 nm, film thickness was controlled by ellipsometry, film topography by AFM). Both methods are sensitive to different probes; where SHS senses entropy fluctuations while BDS measures dipole fluctuations. For BDS measurements, a recently developed nano-structured electrode sample arrangement is employed, where ultra-thin films are spin-coated on an ultra-flat highly conductive silicon wafer, sandwiched between a wafer with nanostructured SiO2 nano-spacers with heights between 35 nm and 70 nm. For PVME films, two thickness independent processes were observed and interpreted to be the α-processes of a bulk-like layer and a process due to an absorbed layer to the substrate. This adsorbed layer further undergoes a confinement effect that results in the localization of the segmental dynamics, which results in an Arrhenius-like temperature dependence. A detailed analysis of the dielectric strengths of both processes reveals that the thickness of the adsorbed layer decreases with increasing temperature, while that of the bulk-like layer increases. For the blend system, by measuring the dynamic Tg in dependence of the film thickness, SHS showed that the Tg of the whole film was strongly influenced by a nanometer-thick surface layer at the polymer/air interface due to a self-assembling process. The dynamic Tg obtained from the SHS measurements decreased with decreasing film thickness. On the other hand, BDS measurements showed a completely different behavior. At high temperatures, the temperature dependence of the relaxation times of the films follows that of bulk-like PS/PVME; obeying the VFT-law. With decreasing temperature, the temperature dependence deviates from the VFT to an Arrhenius law; where the apparent activation energy decreases with decreasing film thickness. This is the first example where confinement induced changes were observed by BDS for ultra-thin films. All results were analyzed in detail in a comprehensive discussion.
Specific heat spectroscopy was used to study the dynamic glass transition of ultrathin poly(2-vinyl pyridine) films (thicknesses: 405–10 nm). The amplitude and the phase angle of the differential voltage were obtained as a measure of the complex heat capacity. In a traditional data analysis, the dynamic glass transition temperature Tg is estimated from the phase angle. These data showed no thickness dependency on Tg down to 22 nm (error of the measurement of ±3 K). A derivative-based method was established, evidencing a decrease in Tg with decreasing thickness up to 7 K, which can be explained by a surface layer. For ultrathin films, data showed broadening at the lower temperature side of the spectra, supporting the existence of a surface layer. Finally, temperature dependence of the heat capacity in the glassy and liquid states changes with film thickness, which can be considered as a confinement effect.
Despite the many controversial discussions about the nanometric confinement effect and the predictions of the three-layer model, much remain not understood and/or experimentally unproven. Here, a combination of Broadband Dielectric Spectroscopy (BDS), Specific Heat Spectroscopy (SHS), and ellipsometry was utilized to investigate the glassy dynamics of ultra-thin films of Poly (vinyl methyl ether) (PVME) and PVME/Polystyrene (PS) 50:50 wt-% miscible blend (thicknesses: 8nm - 200nm). For BDS measurements, a recently developed nano-structured sample arrangement; where ultra-thin films are spin-coated on an ultra-flat highly conductive silicon wafer and sandwiched between a wafer with nanostructured silica nano-spacers, was used. For PVME films, two processes were observed and interpreted to be the α-processes of a bulk-like layer and an absorbed layer to the substrate. BDS and SHS showed that glassy dynamics are bulk-like. However, for films lower than 15nm, BDS showed weakly slowed dynamics. For PVME/PS blend, by a self-assembling process, a nanometer-thin surface layer with a higher molecular mobility is formed at the polymer/air interface. By measuring the dynamic Tg in dependence on the film thickness, both BDS and SHS, showed that the Tg of the whole film was strongly influenced by that nanometer thick surface layer, with a lower Tg.
Despite the decade long controversial discussion on the effect of nanometer confinement on the glass transition temperature (Tg) of ultrathin polymer films, there is still no consistent picture. Here, the dynamic calorimetric glass transition of ultrathin films of a blend, which is miscible in the bulk, is directly investigated by specific heat spectroscopy. By a self-assembling process, a nanometer thick surface layer with a higher molecular mobility is formed at the polymer/air interface. By measuring the dynamic calorimetric Tg in dependence on the film thickness, it was shown that the Tg of the whole film was strongly influenced by that nanometer thick surface layer, with a lower Tg. Since the observed thickness dependence of the dynamic Tg is similar to the thickness dependence of the Tg for thin films of homopolymers, it is concluded that also for homopolymer a highly mobile surface layer is relevant for the widely observed Tg depression.
Two methods were employed to prepare hyperbranched polyamine ester (HPAE)/kaolinite (Ka) nanocomposites resulting in different morphologies. In the case of the in situ polymerization, diethanolamine is inserted as monomer between the Ka layers and polymerized with methyl acrylate to prepare HPAE/Ka–DEA nanocomposites. For the ex situ method, Ka is modified with dodecylamine and solution-blended with HPAE. The former method leads to an intercalated morphology where the latter approach results in an exfoliated structure, as proofed by SAXS and TEM. A complementary combination of methods like differential scanning calorimetry (DSC), broadband dielectric relaxation (BDS), and specific heat spectroscopy (SHS) was used to investigate both kinds of nanocomposites in detail. Above Tg, the dielectric spectra are dominated by the conductivity contribution while the segmental dynamics is retrieved by SHS. A comparison of the temperature dependencies reveals a decoupling of segmental dynamics and conductivity, which becomes weaker with decreasing fragility.
In the recent years, highly crosslinked plasma polymers have started to unveil their potential in numerous biomedical applications in thin-films form. However, conventional diagnostic methods often fail due to their diverse molecular dynamics conformations. Here, glassy dynamics and the melting transition of thin PEO-like plasma assisted deposited (ppPEO) films (thickness 100 nm) were In situ studied by a combination of specific heat spectroscopy, utilizing pJ/K sensitive AC-calorimeter chip, and composition analytical techniques. Different crosslinking densities were obtained by different plasma powers during the deposition of the films. Glassy dynamics was observed for all values of the plasma power. It was found that the glassy dynamics slows down with increasing the plasma power. Moreover, the underlying relaxation time spectra broaden indicating that the molecular motions become more heterogeneous with increasing plasma power. In a second set of experiment, the melting behavior of the ppPEO films was studied. The melting temperature of ppPEO was found to be decreasing with increasing plasma power. This was explained by a decrease of the order in the crystals due to formation of chemical defects during the plasma process.
The thermodynamic behavior of thin PVME films including the irreversible adsorbed layer on the substrate is investigated. In a first step, the growth kinetics of the adsorbed layer was studied combining a leaching technique and atomic force microscopy. Further, it was shown that there is a critical initial film thickness for the formation of a surface-filling adsorbed layer. Additionally, spectroscopic ellipsometry measurements were carried out to investigate the influence of the adsorbed layer on the glass transition temperature of the thin films. For 30 nm films and below, the influence of the adsorbed layer percolates strongly to the bulk-like layer of the film. Finally, the molecular dynamics of the adsorbed layer was studied by broadband dielectric spectroscopy, employing nanostructured-electrode systems. One process was revealed, which was assigned either to molecular fluctuations taking place in a loosely-bounded the part of the adsorbed layer, or to the desorption/adsorption of segments at the substrate.
Specific heat spectroscopy (SHS) employing AC nanochip calorimetry was used to investigate the glassy dynamics of ultra-thin films (thicknesses: 10 nm–340 nm) of a polymer blend, which is miscible in the bulk. In detail, a Poly(vinyl methyl ether) (PVME)/Polystyrene (PS) blend with the composition of 25/75 wt. % was studied. The film thickness was controlled by ellipsometry while the film topography was checked by atomic force microscopy. The results are discussed in the framework of the balance between an adsorbed and a free surface layer on the glassy dynamics. By a self-assembling process, a layer with a reduced mobility is irreversibly adsorbed at the polymer/substrate interface. This layer is discussed employing two different scenarios. In the first approach, it is assumed that a PS-rich layer is adsorbed at the substrate. Whereas in the second approach, a PVME-rich layer is suggested to be formed at the SiO2 substrate. Further, due to the lower surface tension of PVME, with respect to air, a nanometer thick PVME-rich surface layer, with higher molecular mobility, is formed at the polymer/air interface. By measuring the glassy dynamics of the thin films of PVME/PS in dependence on the film thickness, it was shown that down to 30 nm thicknesses, the dynamic Tg of the whole film was strongly influenced by the adsorbed layer yielding a systematic increase in the dynamic Tg with decreasing the film thickness. However, at a thickness of ca. 30 nm, the influence of the mobile surface layer becomes more pronounced. This results in a systematic decrease in Tg with the further decrease of the film thickness, below 30 nm. These results were discussed with respect to thin films of PVME/PS blend with a composition of 50/50 wt.%as well as literature results.
Advances in functional coatings, batteries, innovative organic electronics, and hybrid materials depend strongly on polymeric materials confined in thin films or adsorbed at surfaces. Subsequently, understanding the materials behavior under confinement and the deviations, from the bulk, that might arise is necessary for optimized technological applications. In the nanometer vicinity, solid interfaces and free surfaces could alter for instance entanglements, glassy dynamics (α-relaxation), and the thermal glass transition temperature (Tg), compared to the bulk behavior. Consequently, this could change macroscopic quantities of thin films like adhesion, wettability, friction, reactivity, and biocompatibility, which are topical problems for hybrid materials. In fact, despite the intense investigations on thin homopolymers films, little is known about polymer blend thin films and how blending affect glass dynamics and glass transition, under confinement.
This work discusses the glassy dynamics of thin films of Poly (vinyl methyl ether) (PVME) with special focus to the dynamics near the interfaces. Further, PVME is then blended with the well-studied polystyrene (PS) in two concentrations; 50:50 and 25:75 wt-%, which are miscible in bulk. The glass dynamics of thin films of both blend concentration are then investigated. Here, a combination of nanosized relaxation spectroscopies; broadband dielectric spectroscopy (BDS) and specific heat spectroscopy (SHS); employing AC nanochip calorimetry, was utilized to probe the glassy dynamics of the thin films, thickness: 7nm – 200 nm. It should be noted that both methods are sensitive to different probes; where SHS senses entropy fluctuations while BDS measures dipole fluctuations. For BDS measurements, a recently developed nano-structured electrode sample arrangement was employed; where ultra-thin films are spin-coated on an ultra-flat highly conductive silicon wafer, sandwiched between a wafer with nanostructured SiO2 nano-spacers with heights between 35 nm and 70 nm. Furthermore, these measurements are then combined with surface analytical techniques; ellipsometry and AFM, for controlled film thickness and topography.
Probing of PVME thin films revealed the existence of an adsorbed layer with a restricted mobility at the polymer/substrate interface, which is independent from the bulk-like behavior and thickness independent. As for PVME/PS thin films, it was shown that the overall segmental dynamics of both blends are strongly affected by a fine counter-balance between a free surface layer at the polymer/air interface, which is PVME-rich layer, and an adsorbed layer at the polymer/substrate interface, which is PS-rich. This is the first example where confinement induced changes were observed by BDS for ultra-thin films. All results were analyzed in details and will be comprehensively discussed.
A combination of nanosized dielectric relaxation (BDS) and thermal spectroscopy (SHS) was utilized to characterize the dynamics of thin films of Poly(vinyl methyl ether) (PVME) (thicknesses: 7 nm – 160 nm). For the BDS measurements, a recently designed nano-structured electrode system is employed. A thin film is spin-coated on an ultra-flat highly conductive silicon wafer serving as the bottom electrode. As top electrode, a highly conductive wafer with non-conducting nanostructured SiO2 nano-spacers with heights of 35 nm or 70 nm is assembled on the bottom electrode. This procedure results in thin supported films with a free polymer/air interface. The BDS measurements show two relaxation processes, which are analyzed unambiguously for thicknesses smaller than 50 nm. The relaxation rates of both processes have different temperature dependencies. One process coincidences in its position and temperature dependence with the glassy dynamics of bulk PVME and is ascribed to the dynamic glass transition of a bulk-like layer in the middle of the film. The relaxation rates were found to be thickness independent as confirmed by SHS. Unexpectedly, the relaxation rates of the second process obey an Arrhenius-like temperature dependence. This process was not observed by SHS and was related to the constrained fluctuations in a layer, which is irreversibly adsorbed at the substrate with a heterogeneous structure. Its molecular fluctuations undergo a confinement effect resulting in the localization of the segmental dynamics. To our knowledge, this is the first report on the molecular dynamics of an adsorbed layer in thin films.
In thin polymer films, little is known about the dynamics of the adsorbed layers, despite their importance in innovative applications. Here, Broadband Dielectric Spectroscopy (BDS) was utilized to investigate the glassy dynamics of thin films of a low MW Poly (vinyl methyl ether) (PVME) (thicknesses: 7 – 160 nm). A recently developed nano-structured capacitor arrangement was employed; where a silicon wafer with nanostructured SiO2 nano-spacers, with heights of 35 nm and 70 nm, is placed on top of a thin film spin coated on an ultra-flat highly conductive silicon wafer. Further, PVME/SiO2 interactions was confirmed by contact angle measurements, hence an adsorbed layer is allowed to form. For films with thicknesses smaller than 50 nm, BDS measurements showed two relaxation processes. The first process coincided, in its position and temperature dependence, with the -relaxation of bulk PVME, thus it was assigned to the -relaxation of a bulk-like layer. The second process showed a different temperature dependence and was ascribed to the relaxation of polymer segments adsorbed at the substrate. Both processes showed no thickness dependence. The results will be discussed in detail. To our knowledge, this is the first study of the segmental dynamics of an adsorbed layer in thin films.
The discussions on the nanoconfinement effect on the glass transition and glassy dynamics phenomena have yielded many open questions. Here, the thickness dependence of the thermal glass transition temperature of thin films of a PVME/PS blend is investigated by ellipsometry. Its thickness dependence was compared to that of the dynamic glass transition (measured by specific heat spectroscopy), and the deduced Vogel temperature (T0). While and T0 showed a monotonous increase, with decreasing the film thickness, the dynamic glass transition temperature () measured at a finite frequency showed a non-monotonous dependence that peaks at 30 nm. This was discussed by assuming different cooperativity length scales at these temperatures, which have different sensitivities to composition and thickness. This non-monotonous thickness dependence of disappears for frequencies characteristic for T0. Further analysis of the fragility parameter, showed a change in the glassy dynamics from strong to fragile, with decreasing film thickness.
Unraveling the Dynamics of Nanoscopically Confined PVME in Thin Films of a Miscible PVME/PS Blend
(2017)
Broadband dielectric spectroscopy (BDS) was employed to investigate the glassy dynamics of thin films (7−200 nm) of a poly(vinyl methyl ether) (PVME)/polystyrene (PS) blend (50:50 wt %). For BDS measurements, nanostructured capacitors (NSCs) were employed, where films are allowed a free surface. This method was applied for film thicknesses up to 36 nm. For thicker films, samples were prepared between crossed electrode capacitors (CECs). The relaxation spectra of the films showed multiple processes. The first process was assigned to the α-relaxation of a bulklike layer. For films measured by NSCs, the rates of α-relaxation were higher compared to those of the bulk blend. This behavior was related to the PVME-rich free surface layer at the polymer/air interface. The second process was observed for all films measured by CECs (process X) and the 36 nm film measured by NSCs (process X2). This process was assigned to fluctuations of constraint PVME segments by PS. Its activation energy was found to be thickness-dependent because of the evidenced thickness dependency of the compositional heterogeneity. Finally, a third process with an activated temperature dependence was observed for all films measured by NSCs (process X1). It resembled the molecular fluctuations in an adsorbed layer found for thin films of pure PVME, and thus, it is assigned accordingly. This process undergoes an extra confinement because of frozen adsorbed PS segments at the polymer/substrate interface. To our knowledge, this is the first example where confinement-induced changes were observed by BDS for blend thin films
For many years now, the so-called three layer model (free-surface, bulk-like, and adsorbed layers) has been commonly used, along with other parameters, to explain the deviations seen in glass transition and glassy dynamics for polymers confined into thin films, compared to their bulk value. Nevertheless, due to the hard accessibility of the adsorbed layers in supported films, little is known about the nature of their dynamics and how they really influences the overall dynamics of the thin films. Here, the irreversibly self-assembled adsorbed layer of a low MW Poly (vinyl methyl ether) (PVME) is solvent-leached from a 200 nm film. The thickness and topography of this layer is checked with Atomic Force Microscopy (AFM), to insure no dewetting and low roughness. Further, the dynamics of the adsorbed layer is then in-situ probed with Broadband Dielectric Spectroscopy (BDS). A recently developed nano-structured capacitor arrangement was employed; where a silicon wafer with nanostructured SiO2 nano-spacers, with heights of 35 nm, is placed on top of a thin film spin coated on an ultra-flat highly conductive silicon wafer. All results will be discussed in detail and quantitatively compared to our recent work on the glassy dynamics of PVME thin films (50 nm- 7nm), where BDS measurements showed two thickness-independent relaxation processes. The first process was assigned to the -relaxation of a bulk-like layer. Whereas the second process showed a different temperature dependence and was ascribed to the relaxation of polymer segments adsorbed at the substrate. To our knowledge, this is the first in-situ study of the dynamics of an irreversibly adsorbed layer.
The molecular mobility of the highly asymmetric miscible blend poly(vinyl methyl ether)/polystyrene was investigated by broadband dielectric (frequency range 10^-1 Hz – 10^9 Hz) and specific heat spectroscopy (frequency range 10^1 Hz – 10^4 Hz). The dielectric spectra revealed a complex molecular dynamic behavior, where three different relaxation processes were observed. At temperatures below the glass transition temperature an α´-relaxation was found, with an Arrhenius-like temperature dependence of its relaxation rates. It is assigned to localized fluctuations of the confined PVME segments within a frozen glassy matrix dominated by PS. Above the thermal glass transition temperature two processes with a VFT behavior of their relaxation rates were detected called α1- and α2-relaxation, both originating from PVME dipoles fluctuating in PS-rich environments, however with diverse PS concentrations. The relevant length scales for the processes are assumed to be different, corresponding to the Kuhn segment length for the former relaxation and to the CRR for the latter one. The observed multiple glassy dynamics result from spatial local compositional heterogeneities on a microscopic level. Additionally, SHS investigations were performed for the first time for this system, proving an existence of a fourth relaxation process (α3-relaxation) due to the cooperative fluctuations of both PS and PVME segments. The separation between the thermal α3- and dielectric α2-relaxation increases dramatically with increasing polystyrene concentration, proving that the thermal response is dominated by PS.
Copper has a strong bactericidal effect against multi-drug resistant pathogens and polyethers are known for their resistance to biofilm formation. Herein, we combined Cu nanoparticles (NPs) and a polyether Plasma polymer in the form of nanocomposite thin films and studied whether both effects can be coupled. Cu NPs were produced by magnetron sputtering via the aggregation in a cool buffer gas whereasolyether layers were synthesized by Plasma-Assisted Vapor Phase Deposition with poly(ethylene oxide) (PEO) used as a precursor. In situ specific heat spectroscopy and XPS analysis revealed the formation of a modified polymer layer around the NPs which propagates on the scale of a few nanometers from the Cu NP/polymer interface and then transforms into a bulk polymer phase. The chemical composition of the modified layer is found to be ether-deficient due to the catalytic influence of copper whereas the bulk polymer Phase exhibits the chemical composition close to the original PEO. Two cooperative glass transition phenomena are revealed that belong to the modified polymer layer and the bulk phase. The former is characterized by constrained mobility of polymer segments which manifests itself via a 30 K increase of dynamic glass transition temperature. Furthermore, the modified layer is characterized by the heterogeneous structure which results in higher fragility of this layer as compared to the bulk phase. The Cu NPs/polyether thin films exhibit reduced Protein adsorption; however, the constrained segmental dynamics leads to the Deterioration of the non-fouling properties for ultra-thin polyether coatings. The films are found to have a bactericidal effect against multi-drug resistant Gram-positive Methicillin-Resistant Staphylococcus aureus and Gram-negative Pseudomonas aeruginosa.
Thin polymeric films are of great importance of high number of high-tech applications for instance in sensors and nanoelectronics. Form the scientific point of view thin films with thickness below 100 nm are ideal model systems to study confinement effects on its properties for instance on the molecular relaxation processes. In this contribution an overview is presented about the behavior of different systems as investigated by nanosized relaxation spectroscopy like broadband dielectric spectroscopy employing nano structured capacitors and AC chip calorimetry complimented by ellipsometry. The systems considered are PVME1, PVME/PS blends2,3 P2VP4, PBAC5 and polysulfone6. Besides the film also the adsorbed layer on the substrate prepared by a leaching approach and investigated by AFM is considered.1,4-7. For these investigationsss it is found that the adsorbed layer itself exhibits a relaxation dynamics which might be assigned either to molecular motions or to adsorptions desorption kinetics.