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In order to provide further evidence of damage mechanisms predicted by the solid-state transformation creep (SSTC) model, direct observation of damage accumulation during creep of Al–3.85Mg was made using synchrotron X-ray refraction (SXRR). X-ray refraction techniques capture the specific surface (i.e. surface per unit volume) with a field of view comparable to the specimen size but with microscopic sensitivity. A significant rise of the internal specific surface with increasing creep time was observed, providing evidence for the creation of a fine grain substructure, as predicted by the SSTC model.