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- Beitrag zu einem Tagungsband (18) (entfernen)
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- X-ray refraction (7)
- Computed tomography (4)
- Phase contrast (3)
- Soft matter radiography (3)
- Diffuse background (2)
- Edge artefact (2)
- Fluorescent screen (2)
- Huygens elementary waves (2)
- Radiography (2)
- Synchrotron radiation (2)
Organisationseinheit der BAM
We investigated to our knowledge for the first time the capabilities of long period gratings (LPG) in single-mode microstructured polymer optical fibre (mPOF) as real-time gamma dosimeter. The fibre is made from polymethyl methacrylate (PMMA) with a polycarbonate jacket. We measured the radiation-induced wavelength shift of the mPOF LPG loss feature wavelength and the radiation-induced attenuation of a mPOF for
different wavelength between 600 nm and 800 nm for gamma radiation with an energy distribution between 6 keV and 18 keV.
A novel approach to strongly suppress artifacts in radiography and computed tomography caused by the effect of diffuse background Signals (backlight) of 2D X-ray detectors is suggested. Depending on the detector geometry the mechanism may be different, either based on the optical scattering of the fluorescent screen materials into optical detection devices or Compton or X-ray fluorescence scattering by the detector components. Consequently, these erroneous intensity portions result in locally different violations of Lambert Beers law in single projections (radiographs).
When used as input data for computed tomography these violations are directly observed via modulation of the projected mass as a function of the rotation Phase and the samples aspect ratio (dynamics). The magnitude of the diffuse Background signal depends on the detector area covered by the projected sample. They are more pronounced the smaller the shaded area and the stronger the total attenuation.
Moreover, the local intensity mismatch depends on the attenuation of the sample.
We present very basic reference data measured with multiple metal foils at a synchrotron radiation source. Beam hardening artifacts can be excluded due to the monochromatic radiation. The proposed correction procedure assumes a constant (non-local) scattering mechanism.
The high-resolution synchrotron-based imaging stations at the BAMline (BESSY) and TopoTomo (ANKA)
(2008)
The BAMline at the BESSY light source in Berlin and the TopoTomo beamline at the ANKA synchrotron facility in Karlsruhe (both Germany) operate in the hard X-ray regime (above 6 keV) with similiar photon flux density. For typical imaging applications, a double multilayer monochromator or a filtered white beam is used. In order to optimise the field of view and the resolution of the available indirect pixel detectors, different optical systems have been installed, adapted, respectively, to a large field of view (macroscope) and to high spatial resolution (microscope). They can be combined with different camera systems, ranging from 16-bit dynamic range slow-scan CCDs to fast CMOS cameras. The spatial resolution can be brought substantially beyond the micrometer limit by using a Bragg magnifier. The moderate flux of both beamlines compared to other 3rd generation light sources is compensated by a dedicated scintillator concept. For selected applications, X-ray beam collimation has proven to be a reliable approach to increase the available photon flux density. Absorption contrast, phase contrast, holotomography and refraction-enhanced imaging are used depending on the application. Additionally, at the TopoTomo beamline digital white beam synchrotron topography is performed, using the digital X-ray pixel detectors installed.
A novel approach to strongly suppress artifacts in radiography and computed tomography caused by the effect of
diffuse background signals ('backlighting') of 2D X-ray detectors is suggested. Depending on the detector
geometry the mechanism may be different, either based on the optical scattering of the fluorescent screen
materials into optical detection devices or Compton or X-ray fluorescence scattering by the detector components.
Consequently, these erroneous intensity portions result in locally different violations of Lambert Beers law in
single projections (radiographs) as function of the detector area coverage and the magnitude of the attenuation.
The absorption of multiple metal sheets is investigated by monochromatic synchrotron radiation, thus excluding
beam hardening. The proposed correction procedure simply requires the individual subtraction of one and the
same fraction of the primary and transmitted mean intensity, as a constant (non-local) scattering mechanism is
assumed.
The relevance of nano sized structures and interfaces in upcoming technologies requires new non-destructive Xray
techniques exploiting attenuation as well as scattering. In the course of driving the resolution and the contrast
of modern radiography into micro and nano metre dimension the inevitable scattering effects require increased
attention. Several radiologists interpret the observed edge artefacts simply by 'phase contrast' due to different
X-ray path lengths within the sample and others refer to Fresnel scattering. The ultra small angle scattering is of
high intensity and may reach the level of the primary beam. We present monochromatic synchrotron
measurements on rather simply shaped objects (such as plates and cylinders) which prove clearly the dominance
of refraction intensity over total reflection and coherent small angle scattering. The refraction conditions hold for
angles of incidence of several degrees to the surface, but typical deflection angles range from several seconds to
minutes of arc. Additionally to the concept of 'phase contrast' of the primary beam its deflection becomes the
essential issue. The appropriate removal of the attenuation contribution enables the imaging of inner surfaces and
interfaces by refraction scanning topography. The presented measurements of reference particles demonstrate the
reliability of laboratory refraction scanners applying X-ray tubes.
Alternative to conventional transmission-based radiography and computed tomography, X-ray refraction techniques are being increasingly used to detect damage in light materials. In fact, their range of application has been recently extended even to metals. The big advantage of X-ray refraction techniques is that they are able to detect nanometric defects, whose size would lie below the resolution of even state-of-the-art synchrotron-based X-ray computed tomography (SXCT). The superiority of synchrotron X-ray refraction radiography and tomography (SXRR and SXRCT) has been shown in the case of light materials, in particular composites. X-ray refraction techniques also yield a quantitifaction of the amount of damage (the so-called relative internal specific surface) and can well be compared with damage models. At the same time, it is impossible for SXRR and SXRCT to image single defects. We show that the combination of refraction- and transmission-based imaging techniques yields an impressive amount of additional information about the type and amount of defects in microstructured materials such as additively manufactured metals or metal matrix composites. We also show that the use of data fusion techniques allows the classification of defects in statistically significant representative volume elements.
The combination of tomographic, microstructural data with other experimental techniques and with modeling is paramount, if we want to extract the maximum amount of information on material and component properties. In particular, quantitative image analysis, statistical approaches, direct discretization of tomographic reconstructions represent concrete possibilities to extend the power of the tomographic 3D representation to insights into the material and component performance. This logic thread holds equally for industrial and academic research, and valorizes expensive experiments such as those carried out at synchrotron sources, which cannot be daily repeated. We shall show a few examples of possible use of X-ray tomographic data for quantitative assessment of damage evolution and microstructural properties, as well as for non-destructive testing. We will also show how X-ray refraction computed tomography (CT) can be highly complementary to classic absorption CT, being sensitive to internal interfaces.