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Beyond classical X-ray techniques are used for the purpose of preferably short-term applications, but some supplementary X-ray and synchrotron techniques for higher resolution microdiagnostics take advantage of scattering effects. In contrast to directly imaging methods their resolution is only limited by the diffraction limit of the X-ray wavelength, far below the atomic dimensions. These techniques of scanning topography and refraction synchrotron tomography may permit the systematic diagnostics for finding and exploiting structure/property relations like correlations among atomic, nano and microstructures with macroscopic properties. Their basic advantage over microscopic techniques is their potential for the non-destructive characterisation of materials, far from invasive sample treatments. They combine scattering and spatial resolution.
Alternative to conventional transmission-based radiography and computed tomography, X-ray refraction techniques are being increasingly used to detect damage in light materials. In fact, their range of application has been recently extended even to metals. The big advantage of X-ray refraction techniques is that they are able to detect nanometric defects, whose size would lie below the resolution of even state-of-the-art synchrotron-based X-ray computed tomography (SXCT). The superiority of synchrotron X-ray refraction radiography and tomography (SXRR and SXRCT) has been shown in the case of light materials, in particular composites. X-ray refraction techniques also yield a quantitifaction of the amount of damage (the so-called relative internal specific surface) and can well be compared with damage models. At the same time, it is impossible for SXRR and SXRCT to image single defects. We show that the combination of refraction- and transmission-based imaging techniques yields an impressive amount of additional information about the type and amount of defects in microstructured materials such as additively manufactured metals or metal matrix composites. We also show that the use of data fusion techniques allows the classification of defects in statistically significant representative volume elements.
Hydrogen in metals can cause a degradation of the mechanical properties with possible subsequent hydrogen assisted cracking (HAC). Though, the mechanism of HAC is not completely understood yet and thus suitable methods for in situ investigations to characterise the crack formation are needed. X-ray computed tomography (CT) is a well-known tool for analysing these properties. However, the effective resolution of the detector system limits the detection of small defects by CT. Analyser based imaging (ABI) takes advantage of x-ray refraction at interfaces between volumes of different density, i.e. of cracks, pores, inclusions, etc., within the sample to detect defects smaller than the resolution of the detector system. In this study, measurements on an aluminium alloy weld showed that ABI allows us to resolve the 3D structure of cracks undetected by absorption based CT. Prospective investigations will analyse HAC in steels.
Röntgenstrahlung eignet sich besonders gut zur zerstörungsfreien Charakterisierung von Werkstoffen. Mit ihrer Hilfe lassen sich z.B. Risse und Poren in Werkstoffen erkennen. Die Risserkennbarkeit ist jedoch von der Rissgröße relativ zum Auflösungsvermögen des Detektors abhängig. Risse, Poren oder Einschlüsse können in Radiogrammen nur dann erkannt werden, wenn sie größer sind als das Detektorelement, das die Röntgenstrahlen registriert. Das hier vorgestellte neuartige Synchrotron-Refraktions-Computer-Tomographie-Verfahren ist jedoch in der Lage, auch Risse zu erkennen, deren Größe weit unterhalb des Auflösungsvermögens des Detektors liegt. Das Verfahren basiert auf dem bisher wenig genutzten Phänomen der Brechung von Röntgenstrahlen an den inneren Grenzflächen mikroskopisch strukturierter Objekte. Durch den Vergleich zwischen absorptionsbasierter und refraktionsbasierter Computer Tomographie Untersuchungen mit Synchrotronstrahlung an einer geschädigten Faserverbundprobe wird das Potenzial der Synchrotron-Refraktions-Computer-Tomographie demonstriert.