Filtern
Dokumenttyp
- Posterpräsentation (3) (entfernen)
Sprache
- Englisch (3)
Referierte Publikation
- nein (3)
Schlagworte
- Core-shell nanoparticles (2)
- Depth-profiling (2)
- Core@Shell Nanoparticles (1)
- Metrology (1)
- PS (1)
- PTFE (1)
- Polymers (1)
- SEM (1)
- STXM (1)
- Synchrotron (1)
Synchrotron-radiation enables the adjustment of the XPS information depth and, thus, the visualization of depth profiles of the elemental composition within the first 10 nm of a surface. This project deals with the analysis of core-shell nanoparticles. It constitutes first steps towards a valid methodology for studying the surface chemistry of nanoparticles in a quantitative and accurate manner.
SrF2 nanoparticles can be doped with trivalent earth metal ions such as Eu3+ and Tb3+ to generate materials exhibiting an intensive red or green fluorescence. A CaF2 shell increases intensity, fluorescence lifetie and quantum yield. The chemical composition of the nanoparticle core-shell region is investigated by XPS at different excitation energies corresponding to different information depths.
A scanning transmission x-ray microscopy (STXM) based methodology is introduced for determining the dimensions (shell thickness, core and total diameter) of core-shell nanoparticles which exhibit a strong x-ray absorption contrast and a well-defined interface between core and shell material. A low radiation dosage during data acquisition and, therefore, less x-ray beam induced damage of the sample is achieved by recording STXM images only at two predetermined energies of maximum absorption contrast, instead of recording a stack of images across the whole absorption edge. A model core-shell nanoparticle, polytetrafluoroethylene (PTFE) cores with polystyrene (PS) shell, is used for demonstration. Near edge x-ray absorption fine structure (NEXAFS) spectroscopy confirms the significant difference in x-ray absorption behavior between PTFE and PS. Additionally, due to the insolubility of styrene in PTFE a well-defined interface between particle core and shell is expected. In order to validate the STXM results, both the naked PTFE cores as well as the complete core-shell nanoparticles are examined by scanning electron microscopy (SEM). The introduced STXM based methodology yields particle dimensions in good agreement with the SEM results (deviation equal or less than 10%) and provides additional information such as the position of the particle core which cannot be extracted from a SEM micrograph.