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- Femtosecond laser (4)
- Optical fiber sensors (4)
- OTDR (3)
- Polymer optical fiber (3)
- POF (2)
- Backscatter measurement (1)
- Bend sensor (1)
- Micromachining (1)
- OFDR (1)
- Polymer (1)
We propose to use focused femtosecond laser pulses to create scattering damage in standard singlemode optical fibres as reference points for quasi-distributed sensing applications. Such sensor fibres are interrogated with incoherent optical frequency domain reflectometry (I-OFDR) technique and optical time domain reflectometry (OTDR). A performance comparison of both techniques with the clear advantage of the I-OFDR is presented as well as a quasi-distributed length change measurement application. Also dynamic measurement based on the I-OFDR technique is demonstrated on a femtosecond laser-induced sensor chain.
Focused femtosecond laser pulses are used to create scattering damage in the core of polymer optical fibers (POF). The resulting structures are investigated regarding morphology by light microscopy and backscattered intensity using optical time domain reflectometry (OTDR). Quasi-distributed optical fiber sensing is proposed by evaluating backscatter changes at the inscribed scatter centers. Application examples for quasi-distributed measurement of fiber bends and temperature are demonstrated.
We propose focused femtosecond laser irradiation to create stable and permanent scattering damage in large-core polymer optical fibers. Possible sensing applications using optical time domain reflectometry are discussed and presented. Experiments show that quasi-distributed fiber bend sensors and absolute temperature sensors can be realized by evaluating backscatter intensities.
We propose to use focused femtosecond laser pulses to inscribe Scattering damage in the core of polymer optical fibers for interrogation as quasi-distributed sensor points by optical time domain reflectometry.
Fiber bend measurement is demonstrated on off-center inscribed sensor points and absolute temperature measurement is presented by evaluation of the constant backscatter intensities from the inscribed structures relative to temperature-dependent Rayleigh Scattering. Application possibilities and limitations of this new approach are discussed.