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Eingeladener Vortrag
- nein (42)
X-ray refraction is analogous to visible light deflection by matter; it occurs at boundaries between different media. The main difference between visible light and X-rays is that in the latter case deflection angles are very small, from a few seconds to a few minutes of arc (i.e., the refraction index n is near to 1). Trivially but importantly, deflection of X-rays is also sensitive to the orientation of the object boundaries. These features make X-ray refraction techniques extremely suitable to a) detect defects such as pores and microcracks and quantify their densities in bulk (not too heavy) materials, and b) evaluate porosity and particle properties such as orientation, size, and spatial distribution (by mapping). While X-ray refraction techniques cannot in general image single defects, their detectability is simply limited by the wavelength of the radiation.
We thereby show the application of X-ray refraction 2D mapping (topography) and tomography to different sorts of problems in materials science and technology: 1) Sintering of SiC green bodies; 2) Porosity analysis in additively manufactured alloys; 3) Fiber de-bonding in metal and polymer matrix composites.
Such techniques, especially at the Synchrotron BESSY II, Berlin, Germany, can be used in-situ, i.e. when the specimen is subjected to temperatures or external loads. Applications of in-situ X-ray refraction radiography on aluminum alloys and composites are also shown.
The use of X-ray refraction analysis yields quantitative information, which can be directly input in kinetics, mechanical and damage models.
X-ray refraction is based on optical deflection of X-rays, similar to the well-known small angle X-ray scattering, but hundreds of times more intense, thus enabling shorter measurement time. We show that X-ray refraction techniques are suitable for the detection of pores, cracks, and in general defects. Indeed, the deflected X-ray intensity is directly proportional to the internal specific surface (i.e., surface per unit volume) of the objects. Although single defects cannot be imaged, the presence of populations of those defects can be detected even if the defects have sizes in the nanometer range.We present several applications of X-ray refraction techniques to composite materials:- To visualize macro and microcracks in Ti-SiC metal matrix composites (MMC);- To correlate fatigue damage (fibre de-bonding) of carbon fibre reinforced plastics (CFRP) to X-ray refraction intensity;- To quantify the impact damage by spatially resolved single fibre de-bonding fraction as a function of impact energy in CFRP laminates.An example of classic high-resolution computer tomography of an impact-damaged CFRP will also be presented, as a benchmark to the present state-of-the-art imaging capabilities. It will be shown that while (absorption) tomography can well visualize and quantify delamination, X-ray refraction techniques directly yield (spatially resolved) quantitative information about fibre de-bonding, inaccessible to absorption tomography.
X-ray refraction is analogous to visible light deflection by matter; it occurs at boundaries between different media. The main difference between visible light and X-rays is that in the latter case deflection angles are very small, from a few seconds to a few minutes of arc (i.e., the refraction index n is near to 1). Importantly, deflection of X-rays is also sensitive to the orientation of the object boundaries. These features make X-ray refraction techniques extremely suitable to a) detect defects such as pores and microcracks and quantify their densities in bulk (not too heavy) materials, and b) evaluate porosity and particle properties such as orientation, size, and spatial distribution (by mapping). While X-ray refraction techniques cannot in general image single defects, they can detect objects with size above a few wavelengths of the radiation.
Such techniques, especially at the Synchrotron BESSY II, Berlin, Germany, can be used in-situ, i.e. when the specimen is subjected to temperatures or external loads.
The use of X-ray refraction analysis yields quantitative information, which can be directly input in kinetics, mechanical and damage models.
We hereby show the application of non-destructive X-ray refraction radiography (SXRR, 2D mapping also called topography) to problems in additive manufacturing:
1) Porosity analysis in PBF-LM-Ti64. Through the use of SXRR, we could not only map the (very sparse) porosity distribution between the layers and quantify it, but also classify, and thereby separate, the filled porosity (unmolten powder) from the keyhole and gas pores (Figure 1).
2) In-situ heat treatment of laser powder bed fusion PBF-LM-AlSi10Mg to monitor microstructure and porosity evolution as a function of temperature (Figure 2). By means of SXRR we indirectly observed the initial eutectic Si network break down into larger particles as a function of increasing temperature. We also could detect the thermally induced porosity (TIP). Such changes in the Si-phase morphology upon heating is currently only possible using scanning electron microscopy, but with a much smaller field-of-view. SXRR also allows observing the growth of some individual pores, usually studied via X-ray computed tomography, but again on much smaller fields-of-view.
Our results show the great potential of in-situ SXRR as a tool to gain in-depth knowledge of the defect distribution and the susceptibility of any material to thermally induced damage and/or microstructure evolution over statistically relevant volumes.
3D structural investigations are described by X-ray laminography studies of sandwich shell segments, made of a PVC foam core, covered by non-crimp fabric glass fibre composite lay-ups processed by vacuum assisted resin infusion of epoxy. The specific scope of this study is to image transversal flaws within the foam core (joints) and of single ply overlaps. Test flaws were purposely implemented in order to simulate typical failure under cyclic load. In a dedicated test rig for shell structures, the flaw evolution/propagation is monitored by thermography and optical 3D inspection of deformation. Due to the unfavourable preconditions for classical computed tomography as of large aspect ratio, the samples were investigated by coplanar translational laminography. Its limited range of observation angles of ± 45°, results in anisotropic artefacts about the normal to the sample surface, but the typical flaws are well visualized in the as-prepared state, in a state of early damage, and in the repaired state.
3D structural investigations are described by X-ray laminography studies of sandwich shell segments, made of a PVC foam core, covered by non-crimp fabric glass fibre composite lay-ups processed by vacuum assisted resin infusion of epoxy. The specific scope of this study is to image transversal flaws within the foam core (joints) and of single ply overlaps. Test flaws were purposely implemented in order to simulate typical failure under cyclic load. In a dedicated test rig for shell structures, the flaw evolution/propagation is monitored by thermography and optical 3D inspection of deformation. Due to the unfavourable preconditions for classical computed tomography as of large aspect ratio, the samples were investigated by coplanar translational laminography. Its limited range of observation angles of ± 45°, results in anisotropic artefacts about the normal to the sample surface, but the typical flaws are well visualized in the as-prepared state, in a state of early damage, and in the repaired state.
X-ray dark field imaging
(2014)
A new kind of enhanced contrast X-ray imaging of weakly absorbing materials in dark field mode is presented.
Samples such as plastics and biological tissue are a perpetual challenge for radiographic imaging. Recent innovative approaches such as Diffraction Enhanced Imaging (DEI), “phase contrast”, grating interferometry (Talbot-Lau), or Refraction Enhanced Imaging (REI) have in common that they yield enhanced contrast based on deflected X-rays.
Here, we introduce a REI modification, which works with a slightly bent single crystal reflecting in Bragg geometry. The samples are placed upstream of the thin crystal within a parallel synchrotron beam. The crystal’s curvature creates a dark-field stripe in the transmission image, similar to the inverse of a Darwin-Prins rocking curve of plane crystals. The reflection condition is met better or worse as a steady function of incidence position.
Refracted beam portions of sample interfaces appear bright on black stripes. The entire image is finally synthesized by multiple dark-field stripes. The technique is an alternative to the mentioned techniques. We demonstrate the technique’s advantage by examples of biological and technical microstructures.
X-ray dark field imaging
(2014)
X-ray compton tomography
(2014)
The potentials of incoherent X-ray Scattering (Compton) tomography are investigated. Imaging materials of very different density or atomic number at once is a perpetual challenge for X-ray tomography or radiography, in general. In a basic laboratory set-up for simultaneous perpendicular Compton Scattering and direct beam attenuation tomographic scans are conducted by single channel photon counting. This results in asymmetric distortions of the projection profiles of the scattering CT-data set. ln a first approach corrections of Compton scattering data by taking advantage of rotational symmetry yield tomograms without major geometric artefacts.
A cylindrical sample composed of PE, PA, PVC, glass and wood demonstrates similar Compton contrast for all the substances, while the conventional absorption tomogram only reveals the two high order materials.
Compärison to neutron tomography reveals astonishing similarities except for the glass component (without hydrogen). Therefore, Compton CT bears the potential to replace neutron tomography, which requires much more efforts.