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We developed a setup for time- and lateral-resolved X-ray absorption fine structure (XAFS) spectroscopy. A dispersive element is placed behind the sample to investigate. The broadband incoming beam transmits the sample, is then dispersed and finally collected by a position sensitive detector. This allows the recording of a whole X-ray absorption near edge structure (XANES) or extended X-ray absorption fine structure (EXAFS) spectrum in a single shot. The dispersive element is a Si(111) crystal, bent by means of a so called wafer bender, developed in house. Our setup is very flexible, easy to adjust and allows a time resolution down to one second which can be used to follow chemical reactions with dynamics on this time scale.
Our aim is to develop a new simple and inexpensive method for full field X-ray fluorescence imaging . We combine an energy dispersive array detector with a coded aperture to obtain high resolution images . To obtain the information from the recorded image a reconstruction step is necessary . The reconstruction methods we have developed , were tested on simulated data and then applied to experimental data . The first tests were carried out at the BAM line @ BESSY II. This method enables the simultaneous detection of multiple elements , which is important e.g. in the field of catalysis.