Filtern
Erscheinungsjahr
- 2019 (7) (entfernen)
Dokumenttyp
- Zeitschriftenartikel (4)
- Vortrag (2)
- Forschungsdatensatz (1)
Schlagworte
Organisationseinheit der BAM
Eingeladener Vortrag
- nein (2)
We demonstrate the use of a 3D printed radial collimator in X-ray powder diffraction and surface sensitive grazing incidence X-ray diffraction. We find a significant improvement in the overall Signal to background ratio of up to 100 and a suppression of more than a factor 3⋅10⁵ for undesirable Bragg reflections generated by the X-ray “transparent” windows of the sample environment.
The background reduction and the removal of the high intensity signals from the windows, which limit the detector’s dynamic range, enable significantly higher sensitivity in experiments within sample environments such as vacuum chambers and gas- or liquid-cells. Details of the additively manufactured steel collimator geometry, alignment strategies using X-ray fluorescence, and data analysis are also briefly discussed. The flexibility and affordability of 3D prints enable designs optimized for specific detectors and sample environments, without compromising the degrees of freedom of the diffractometer.
AI-reflectivity is a code based on artificial neural networks trained with simulated reflectivity data that quickly predicts film parameters from experimental X-ray reflectivity curves. This project has a common root with (ML-reflectivity)[https://github.com/schreiber-lab/ML-reflectivity] and evolved in parallel. Both are linked to the following publication:
Fast Fitting of Reflectivity Data of Growing Thin Films Using Neural Networks A. Greco, V. Starostin, C. Karapanagiotis, A. Hinderhofer, A. Gerlach, L. Pithan, S. Liehr, F. Schreiber, S. Kowarik (2019). J. Appl. Cryst.
For an online live demonstration using a pre-trained network have a look at github.
X-ray reflectivity (XRR) is a powerful and popular scattering technique that can give valuable insight into the growth behavior of thin films. This study Shows how a simple artificial neural network model can be used to determine the thickness, roughness and density of thin films of different organic semiconductors [diindenoperylene, copper(II) phthalocyanine and alpha-sexithiophene] on silica from their XRR data with millisecond computation time and with minimal user input or a priori knowledge. For a large experimental data set of 372 XRR curves, it is shown that a simple fully connected model can provide good results with a mean absolute percentage error of 8–18% when compared with the results obtained by a genetic least mean squares fit using the classical Parratt formalism. Furthermore, current drawbacks and prospects for improvement are discussed.
The influence of size effects on the thermoelectric properties of thin platinum films is investigated and compared to the bulk. Structural properties, like the film thickness and the grain size, are varied. We correlate the electron mean free path with the temperature dependence of the electrical conductivity and the absolute Seebeck coefficient SPt of platinum. A measurement platform was developed as a standardized method to determine SPt and show that SPt,film is reduced compared to SPt,bulk. Boundary and surface scattering reduce the thermodiffusion and the phonon drag contribution to SPt,film by nearly the same factor. We discuss in detail on behalf of a model, which describes the temperature dependence of the absolute Seebeck coefficient, the influence of size effects of electron-phonon and phonon-phonon interaction on SPt.
We propose to use artificial neural networks (ANNs) for raw measurement data interpolation and signal shift computation and to demonstrate advantages for wavelength-scanning coherent optical time domain reflectometry (WS-COTDR) and dynamic strain distribution measurement along optical fibers. The ANNs are trained with synthetic data to predict signal shifts from wavelength scans. Domain adaptation to measurement data is achieved, and standard correlation algorithms are outperformed. First and foremost, the ANN reduces the data analysis time by more than two orders of magnitude, making it possible for the first time to predict strain in real-time applications using the WS-COTDR approach. Further, strain noise and linearity of the sensor response are improved, resulting in more accurate measurements. ANNs also perform better for low signal-to-noise measurement data, for a reduced length of correlation input (i.e., extended distance range), and for coarser sampling settings (i.e., extended strain scanning range). The general applicability is demonstrated for distributed measurement of ground movement along a dark fiber in a telecom cable. The presented ANN-based techniques can be employed to improve the performance of a wide range of correlation or interpolation problems in fiber sensing data analysis and beyond.