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X-ray backscatter imaging is a well-established NDT technique to inspect complex objects using only a single-sided access. We present a specially designed multi-slit scatter camera consisting of several twisted slits which are parallelly arranged in a metal block. The camera projects one image per slit to the digital detector array, where the images are overlaying each other. The aperture is corrected based on a deconvolution algorithm to focus the overlaying projections into a single representation of the object. In order to achieve high backscatter intensities from an object, it is necessary to optimize the parameters of the backscatter system by simulation.