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- Ergebnisunsicherheit (1)
- Gitterkonstanten (1)
- Lattice parameter refinement (1)
- Neutron diffraction (1)
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- Phase quantification (1)
- Polytypes (1)
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- Rietveld method (1)
Diffraction of hard synchrotron radiation as well as constant-wavelength and time-of-flight neutron diffraction were used for the structural characterization of a silicon carbide powder having extremely low levels of chemical impurities, high perfection of the crystalline lattice and a grain size of up to 150 µm. The presence of three polytypes was ascertained and the ratios of their mass fractions were determined to be w15R : w6H = 0.002,3(8) and w4H : w6H = 0.000,6(2).