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What about ionic liquids as a "hot" reference material candidate to check your EDS below 1 keV?
(2015)
Energy-dispersive X-ray spectrometry (EDX) is one of the most applied methods used for the analysis of the chemical composition of solids and thin films. Recent progress in EDS (Energy Dispersive X-ray Spectrometer) technology has increased the general performance also in the energy range < 1 keV addressing low Z elements. Suitable test materials to be employed especially to check the low-energy EDS performance – also in line with ISO 15632 - are rather limited and mainly based on C K and F K lines. In order to obtain valid results in laboratories accredited in compliance with ISO/IEC 17025 it is necessary to periodically check the instrument performance.
While nano-scaled intermediate and consumer products are omnipresent in many industries, one challenge consists in the development of methods that reliably identify, characterize and quantify nanomaterials both as a substance and in various matrices. For product registration purposes, the European Commission proposed a definition for nanomaterial which requires a quantitative size determination of the primary particles in a sample down to sizes of 1 nm. According to a material is defined as nano if 50% of the primary particles are observed to comprise a smallest dimension <100 nm. The NanoDefine project was set up to develop and validate a robust, readily implementable and cost-effective measurement approach to obtain a quantitative particle size distribution and to distinguish between nano and non-nano materials according to the definition Among the available particle sizing techniques, electron microscopy was found to be one option meeting most of the requirements of the regulation. However, the use of electron microscopy for particle sizing is often limited by cost per sample, availability in industry, particle agglomeration/aggregation, extremely broad size distributions, 2D materials and operator bias in case of manual evaluation.
The interest in nanoparticles remains at a high level in fundamental research since many years and increasingly, nanoparticles are incorporated into consumer products to enhance their performance. Consequently, the accurate and rapid characterization of nanoparticles is more and more demanded. Electron microscopy (SEM, TSEM and TEM) is one of the few techniques which are able to image individual nanoparticles. It was demonstrated recently that the transmission electron microscopy at a SEM can successfully be applied as a standard method to characterize accurately the size (distribution) and shape of nanoparticles down to less than 10 nm.
The certified reference material BAM-L200, a nanoscale stripe pattern for length calibration and specification of lateral resolution, is described. BAM-L200 is prepared from a cross-sectioned epitaxially grown layer stack of AlxGa1–xAs and InxGa1–xAs on a GaAs substrate. The surface of BAM-L200 provides a flat pattern with stripe widths ranging down to 1 nm. Calibration distances, grating periods and stripe widths have been certified by TEM with traceability to the length unit. The combination of gratings, isolated narrow stripes and sharp edges of wide stripes offers plenty of options for the determination of lateral resolution, sharpness and calibration of length scale at selected settings of imaging surface-analytical instruments. The feasibility of the reference material for an analysis of the lateral resolution is demonstrated in detail by evaluation of ToF-SIMS, AES and EDX images. Other applications developed in the community are summarized, too. BAM-L200 fully supports the implementation of the revised International Standard ISO 18516 (in preparation) which is based on knowledge outlined in the Technical Report ISO/TR 19319:2013.
What about ionic liquids as a "hot" reference material candidate to check your EDS below 1 keV?
(2015)
Standardization and metrology are two terms which are used rather rarely at major conferences as well as in scientific publications in the field of microbeam analysis. For laboratories operating under an accreditation scheme the operator of the microscope/microprobe must have available internal, national or international written standards which should be applicable to any quantitative analysis. Hence, requirements, specifications, guidelines or characteristics of methods, instruments or samples are provided with the final goal that these can be used consistently. In this way it is ensured that microbeam analyses results are reliable and meet quality-management requirements.
An energy dispersive X-ray spectrometer operating with a semiconductor detector should be specified in compliance with the ISO standard 15632 [1]. Requirements for specification are: a) a general description of the spectrometer to evaluate its performance, b) the energy resolution with corresponding dead time, c) the P/B ratio in the Fe55 spectrum and, finally, d) the L/K intensity Ratio in a Ni or Cu spectrum to estimate spectrometer efficiency at low energies. Items b) to d) can be easily checked by the user. Related procedures are recommended in the annexes of the standard.