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- Computed tomography (9)
- Reconstruction algorithm (4)
- X-ray refraction (4)
- Phase contrast (3)
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Grating interferometric set-ups have been established in the last decade. They are promising candidates to obtain enhanced image contrast from weakly absorbing micro and nano structures. They are based on X-ray refraction and near-field diffraction using the Talbot effect.
At the expense of taking multiple images, Talbot-Lau grating interferometry allows separating the absorption, refraction, and scattering contributions by analysing the disturbances of a phase grating interference pattern. Contrary to other refraction enhanced methods, this technique can be applied using conventional X-ray tubes (divergent, polychromatic source). This makes it attractive to solve typical non-destructive testing problems.
We investigated the efficiency of phase gratings, i.e. the visibility (the amplitude of oscillations) upon variation of propagation distance and phase grating rotation around an axis parallel to the grid lines. This grating rotation changes the grating shape (i.e. the distributions of phase shifts). This can yield higher visibilities than derived from rectangular shapes.
Our study includes experimental results obtained from synchrotron radiation, as well as simulations for monochromatic radiation. The advantages of Talbot-Lau interferometry are demonstrated at the example of glass capillaries.
Non-destructive Inspection of Ceramic/Composite Materials using Non-classical X-Ray Techniques
(1999)
Micro damage structures of fiber reinforced polymers (FRP) can be characterized nondestructively by X-ray refraction topography, which images inner surfaces. The damage accumulation after fatigue treatment of short glass fiber reinforced polybutylene terephthalate (PBT-GF) is correlated to the applied load and the number of cycles. Micro cracks and fiber/matrix debonding during fatigue can be detected separately due to their different direction of X-ray small angle scattering. The residual strength over the crack surface decreases by a linear decay as 30 %, 60 % and 90 % of the materials lifetime is passed.
The relevance of nano sized structures and interfaces in upcoming technologies requires new non-destructive Xray
techniques exploiting attenuation as well as scattering. In the course of driving the resolution and the contrast
of modern radiography into micro and nano metre dimension the inevitable scattering effects require increased
attention. Several radiologists interpret the observed edge artefacts simply by 'phase contrast' due to different
X-ray path lengths within the sample and others refer to Fresnel scattering. The ultra small angle scattering is of
high intensity and may reach the level of the primary beam. We present monochromatic synchrotron
measurements on rather simply shaped objects (such as plates and cylinders) which prove clearly the dominance
of refraction intensity over total reflection and coherent small angle scattering. The refraction conditions hold for
angles of incidence of several degrees to the surface, but typical deflection angles range from several seconds to
minutes of arc. Additionally to the concept of 'phase contrast' of the primary beam its deflection becomes the
essential issue. The appropriate removal of the attenuation contribution enables the imaging of inner surfaces and
interfaces by refraction scanning topography. The presented measurements of reference particles demonstrate the
reliability of laboratory refraction scanners applying X-ray tubes.
A novel approach to strongly suppress artifacts in radiography and computed tomography caused by the effect of
diffuse background signals ('backlighting') of 2D X-ray detectors is suggested. Depending on the detector
geometry the mechanism may be different, either based on the optical scattering of the fluorescent screen
materials into optical detection devices or Compton or X-ray fluorescence scattering by the detector components.
Consequently, these erroneous intensity portions result in locally different violations of Lambert Beers law in
single projections (radiographs) as function of the detector area coverage and the magnitude of the attenuation.
The absorption of multiple metal sheets is investigated by monochromatic synchrotron radiation, thus excluding
beam hardening. The proposed correction procedure simply requires the individual subtraction of one and the
same fraction of the primary and transmitted mean intensity, as a constant (non-local) scattering mechanism is
assumed.