Filtern
Erscheinungsjahr
- 2013 (1)
Dokumenttyp
- Buchkapitel (1) (entfernen)
Sprache
- Englisch (1) (entfernen)
Referierte Publikation
- nein (1)
Schlagworte
- X-ray diffraction microscopy (1) (entfernen)
Beyond classical X-ray techniques are used for the purpose of preferably short-term applications, but some supplementary X-ray and synchrotron techniques for higher resolution microdiagnostics take advantage of scattering effects. In contrast to directly imaging methods their resolution is only limited by the diffraction limit of the X-ray wavelength, far below the atomic dimensions. These techniques of scanning topography and refraction synchrotron tomography may permit the systematic diagnostics for finding and exploiting structure/property relations like correlations among atomic, nano and microstructures with macroscopic properties. Their basic advantage over microscopic techniques is their potential for the non-destructive characterisation of materials, far from invasive sample treatments. They combine scattering and spatial resolution.