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- X-ray refraction (4) (entfernen)
The relevance of nano sized structures and interfaces in upcoming technologies requires new non-destructive Xray
techniques exploiting attenuation as well as scattering. In the course of driving the resolution and the contrast
of modern radiography into micro and nano metre dimension the inevitable scattering effects require increased
attention. Several radiologists interpret the observed edge artefacts simply by 'phase contrast' due to different
X-ray path lengths within the sample and others refer to Fresnel scattering. The ultra small angle scattering is of
high intensity and may reach the level of the primary beam. We present monochromatic synchrotron
measurements on rather simply shaped objects (such as plates and cylinders) which prove clearly the dominance
of refraction intensity over total reflection and coherent small angle scattering. The refraction conditions hold for
angles of incidence of several degrees to the surface, but typical deflection angles range from several seconds to
minutes of arc. Additionally to the concept of 'phase contrast' of the primary beam its deflection becomes the
essential issue. The appropriate removal of the attenuation contribution enables the imaging of inner surfaces and
interfaces by refraction scanning topography. The presented measurements of reference particles demonstrate the
reliability of laboratory refraction scanners applying X-ray tubes.
For the first time we present direct 2D imaging of refracted X-rays without any discrimination of the Primary radiation. X-refraction works in analogy to visible light optics: X-rays are entirely deflected at interfaces where discontinuities of (electron) density occur. This is demonstrated at the example of inner and outer surfaces of model samples of well-defined geometry (fibres, capillaries, and monodisperse micro particles). The samples are scanned through a 50 μm monochromatic (20 keV) pencil beam. In order to warrant a sufficient angular resolution a 2D detector (pixel size 7 μm) is placed 3 m downstream of the sample. Scanning the sample in micron steps allows for detecting local changes of interface / surface orientation directly in two dimensions. At the actual angular resolution of about 3 seconds of arc (scattering vector increments Δk = 10-3 nm-1) and 50 μm spatial resolution (scanning) the material’s inner surfaces (with nanometer separation) can be characterized even at sampling rates below 1 second per frame. Moreover, our technique is suited to directly determine particle diameters of up to 250 nm by means of diffraction fringes. Some potential applications to technical submicron structures are discussed.
X-ray dark field imaging
(2014)
A new kind of enhanced contrast X-ray imaging of weakly absorbing materials in dark field mode is presented.
Samples such as plastics and biological tissue are a perpetual challenge for radiographic imaging. Recent innovative approaches such as Diffraction Enhanced Imaging (DEI), “phase contrast”, grating interferometry (Talbot-Lau), or Refraction Enhanced Imaging (REI) have in common that they yield enhanced contrast based on deflected X-rays.
Here, we introduce a REI modification, which works with a slightly bent single crystal reflecting in Bragg geometry. The samples are placed upstream of the thin crystal within a parallel synchrotron beam. The crystal’s curvature creates a dark-field stripe in the transmission image, similar to the inverse of a Darwin-Prins rocking curve of plane crystals. The reflection condition is met better or worse as a steady function of incidence position.
Refracted beam portions of sample interfaces appear bright on black stripes. The entire image is finally synthesized by multiple dark-field stripes. The technique is an alternative to the mentioned techniques. We demonstrate the technique’s advantage by examples of biological and technical microstructures.