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- X-ray refraction (12)
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Organisationseinheit der BAM
The first hard X-ray beamline at BESSY II will be installed by BAM and PTB at a superconducting 7 T wavelength shifter. The main optical elements of the beamline are a Double-Multilayer-Monochromator and a Double-Crystal-Monochromator. The two devices can be used separately or in-line. Main applications of monochromatic radiation with photon energies up to 50 keV are X-ray fluorescence analysis, micro-computed tomography, X-ray topography, detector calibration and reflectometry. Calculable undispersed radiation up to 200 keV will be available for radiometric applications.
Different very dilute suspensions of magnetic nanoparticles (magnetite surrounded by an organic shell) in water (ferrofluids) were investigated using small-angle X-ray scattering. It is shown that the scattering originates not only from noncorrelated coreshell nanoparticles, but also from larger structures. By modelling, these structures can be identified as close-packed clusters consisting of coreshell particles (core diameter ~10 nm). The analysis of the radial distance distribution function, obtained by Fourier transformation of the scattered intensity, reveals a lower bound of the mean cluster size of about 40 nm. The formation of clusters is persistent, even in very dilute suspensions.
The morphology and thermal behaviour of polypropylenegraftmaleic anhydride (PPgMA) layered silicate (montmorillonite) nanocomposites were investigated using X-ray diffraction, transmission electron microscopy, differential scanning calorimetry and thermogravimetry. The study focuses on the influence of the presence of oxygen during the preparation of PPgMAnanocomposite using two different modified clays. The nanocomposites show tactoid, intercalated and exfoliated structures side by side with different dominant states depending on the clay used and on the processing conditions. The systems are described as multi-component blends rather than binary blends since the organic ions do not only change the mixing behaviour, but also influence material properties. Beside the physical barrier property of the clay layers also chemical processes were found to play an important role.
The employment of synchrotron radiation for refraction topography of materials has considerable advantages over standard x-ray sources. The much higher beam intensity and the parallel and monochromatic radiation provide faster measurements and better angular and spatial resolution. X-ray refraction techniques image the inner surface and interface concentration of micro-structured materials. This effect of x-ray optics is additional to small-angle scattering by diffraction, when the scattering objects reach micrometre dimensions. We have developed x-ray refraction techniques within the last decade in order to meet the growing demands for improved non-destructive characterization of high-performance composites, ceramics and other low-density materials. Sub-micron particle dimensions, the pore size of ceramics, the crack density distribution and single fibre debonding within damaged composites can be measured and visualized by computer-generated interface topographs. For this purpose investigations are now being performed at the new hard x-ray beamline of the Federal Institute for Materials Research and Testing (BAM) at BESSY, Berlin. This BAMline provides monochromatic radiation of photon energies from 5 to 60 keV from a double multilayer and/or a double-crystal monochromator. A separate instrument is dedicated to the further development and application of synchrotron radiation refraction (SRR) topography. Different from conventional small-angle scattering cameras with collimating slits and pinholes, scattering angles down to a few seconds of arc are selected by a single-crystal analyser, similar to a Bonse-Hart diffractometer. A 20 µm spatial resolution of the scattering micro-structures is achieved by a CCD camera with a fluorescent converter. First SRR topographs of aircraft composites [carbon fibre-reinforced plastics (CFRP), carbon fibre-reinforced ceramics (C/C), metal matrix ceramics (MMC)] will be reported.
Microstructural characterization of porous materials by two-dimensional X-ray refraction topography
(2004)
X-ray refraction topography determines the internal surfaces and interfaces of non-metallic porous materials within the range of namometer to micrometer dimensions. The method is based on refraction of X-rays caused by interfaces of microstructures in heterogeneous materials.
Generally, it permits a non-destructive full volume characterization of the pore topology. The X-ray refraction scanning technique make possible to visualize integral interface properties up to 10 μm spatial resolution by two-dimensional topographic images. It detects the spatially resolved internal surfaces of both, open and closed pores. Comparison to a certified powder reference of uniform grain size and known packing density reveals a quantitative measure for calibration requirements. An investigation on SiC- and Al2O3-ceramics illustrate the quantitative characterization of the internal surface density, pore sizes and their spatial distribution as well as local porosity fluctuations.