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Certification of the mass fractions of trace elements in a medium purity graphite reference material
(2018)
The increasing application of graphite materials in various fields of technology and science enhances the demand for strictly controlled properties which are often directly correlated to the contents of trace element impurities. Therefore, the availability of powerful, rapid and reliable analytical methods for the determination of trace impurities is essential for process and quality control. Certified reference materials, indispensable for the development and validation of appropriate trace analytical methods for the characterization of special purity graphite materials are still lacking. Therefore, BAM in co-operation with the working group “Special Materials” of the committee of chemists of GDMB (Gesellschaft der Metallurgen und Bergleute e.V.) certified an industrially sourced graphite material with genuine elemental impurities.
The candidate material was a commercial product (NBG 18) taken from the customary production line of the producer SGL CARBON, Chedde (France). The homogeneity of the powdered material was assessed by means of ETV-ICP OES and DC Arc-OES. Certification of the candidate reference material was based on an inter-laboratory comparison involving 17 expert laboratories from Germany, France, Slovenia, USA, South Africa. A variety of different mineralization, digestion, leaching, fusion and combustion techniques prior to ICP OES and photometry, methods without sample preparation (INAA, k0-INAA) as well as typical solid sampling methods (ETV-ICP OES, ETV-ICP-MS, SS-ET AAS, DC Arc-OES, MF-DC Arc-OES) were used to characterise the material. Certified mass fractions and their expanded uncertainties (k = 2) were assigned for 27 elements (Al, B, Ba, Be, Ca, Co, Cr, Cu, Fe, K, Li, Mg, Mn, Mo, Na, Ni, P, Pb, S, Si, Sr, Ti, V, W, Y, Zn, Zr), ranging from (0.00050 ± 0.00027) mg/kg for Be to (41 ± 6) mg/kg for Si. Additionally, informative values are given for the: trace element contents of Ag, As, Au, Bi, Cd, Cs, Dy, Eu, Ga, Gd, Hg, In, La, Nb, Rb, Re, Rh, Sb, Sc, Se, Sm, Sn, Ta, Tb, Te, Th, U; method specific values obtained by ETV-ICP OES (BETV and SiETV) and the ash content of the material.
The certified material “BAM-S009 Medium Purity Graphite Powder” is available for purchase from BAM.
Certification of the mass fractions of trace elements in a medium purity graphite reference material
(2018)
The increasing application of graphite materials in various fields of technology and science enhances the demand for strictly controlled properties which are often directly correlated to the contents of trace element impurities. Therefore, the availability of powerful, rapid and reliable analytical methods for the determination of trace impurities is essential for process and quality control. Certified reference materials, indispensable for the development and validation of appropriate trace analytical methods for the characterization of special purity graphite materials are still lacking. Therefore, BAM in co-operation with the working group “Special Materials” of the committee of chemists of GDMB (Gesellschaft der Metallurgen und Bergleute e.V.) certified an industrially sourced graphite material with genuine elemental impurities.
The candidate material was a commercial product (NBG 18) taken from the customary production line of the producer SGL CARBON, Chedde (France). The homogeneity of the powdered material was assessed by means of ETV-ICP OES and DC Arc-OES. Certification of the candidate reference material was based on an inter-laboratory comparison involving 17 expert laboratories from Germany, France, Slovenia, USA, South Africa. A variety of different mineralization, digestion, leaching, fusion and combustion techniques prior to ICP OES and photometry, methods without sample preparation (INAA, k0-INAA) as well as typical solid sampling methods (ETV-ICP OES, ETV-ICP-MS, SS-ET AAS, DC Arc-OES, MF-DC Arc-OES) were used to characterise the material. Certified mass fractions and their expanded uncertainties (k = 2) were assigned for 27 elements (Al, B, Ba, Be, Ca, Co, Cr, Cu, Fe, K, Li, Mg, Mn, Mo, Na, Ni, P, Pb, S, Si, Sr, Ti, V, W, Y, Zn, Zr), ranging from (0.00050 ± 0.00027) mg/kg for Be to (41 ± 6) mg/kg for Si. Informative values are given for further parameters: trace element contents of Ag, As, Au, Bi, Cd, Cs, Dy, Eu, Ga, Gd, Hg, In, La, Nb, Rb, Re, Rh, Sb, Sc, Se, Sm, Sn, Ta, Tb, Te, Th, U; method specific values obtained by ETV-ICP OES (BETV and SiETV) and ash content.
The new certified material is available as BAM Reference Material BAM-S009 Medium Purity Graphite Powder.