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- X-ray refraction (3)
- Bragg magnification (2)
- Coherent imaging (2)
- Computed tomography (2)
- Computertomographie (2)
- Dimensionelles Messen (2)
- Holotomography (2)
- Microtomography (2)
- Non-destructive evaluation (2)
- Scintillator (2)
The use of high brilliance and partial coherent synchrotron light for radiography and computed tomography (CT) allows to image micro-structured, multi-component specimens with different contrast modes and resolutions up to submicrometer range. This is of high interest for materials research, life science and non-destructive evaluation applications. An imaging setup for microtomography and radiography installed at BESSY II (a third generation synchrotron light source located in Berlin, Germany) as part of its first hard X-ray beamline (BAMline) can now be used for absorption, refraction as well as phase contrast dedicated to inhouse research and applications by external users. Monochromatic synchrotron light between 6 keV and 80 keV is attained via a fully automated double multilayer monochromator. For imaging applications the synchrotron beam transmitted by the sample is converted with a scintillator into visible light. By use of microscope optics this luminescence image is then projected onto, e.g., a CCD chip. Several scintillating materials are used in order to optimise the performance of the detector system. Different optical systems are available for imaging ranging from a larger field of view and moderate resolutions (macroscope up to 14 mm x 14 mm field of view) to high resolution (microscope down to 0.35 μm pixel size), offering magnifications from 1.8× to 40×. Additionally asymmetric cut Bragg crystals in front of the scintillator can be used for a further magnification in one dimension by a factor of about 20. Slow and fast cameras are available, with up to 16 bit dynamic range. We show the suitability of the setup for numerous applications from materials research and life science.
The high-resolution synchrotron-based imaging stations at the BAMline (BESSY) and TopoTomo (ANKA)
(2008)
The BAMline at the BESSY light source in Berlin and the TopoTomo beamline at the ANKA synchrotron facility in Karlsruhe (both Germany) operate in the hard X-ray regime (above 6 keV) with similiar photon flux density. For typical imaging applications, a double multilayer monochromator or a filtered white beam is used. In order to optimise the field of view and the resolution of the available indirect pixel detectors, different optical systems have been installed, adapted, respectively, to a large field of view (macroscope) and to high spatial resolution (microscope). They can be combined with different camera systems, ranging from 16-bit dynamic range slow-scan CCDs to fast CMOS cameras. The spatial resolution can be brought substantially beyond the micrometer limit by using a Bragg magnifier. The moderate flux of both beamlines compared to other 3rd generation light sources is compensated by a dedicated scintillator concept. For selected applications, X-ray beam collimation has proven to be a reliable approach to increase the available photon flux density. Absorption contrast, phase contrast, holotomography and refraction-enhanced imaging are used depending on the application. Additionally, at the TopoTomo beamline digital white beam synchrotron topography is performed, using the digital X-ray pixel detectors installed.
Kurzfassung
Röntgen-Computertomographie (CT) ist eine industriell eingeführte Technik zur zerstörungsfreien Fehlererkennung. Seit einiger Zeit werden industrielle CT-Anlagen auch zur Geometriebestimmung, d.h. für dimensionelle Messungen eingesetzt. Bei diesen Messungen treten Messabweichungen auf, die wegen komplexer Einflussgrößen derzeit nur schlecht quantifiziert werden können. Die Größe der beobachteten Messabweichungen erschwert zum Teil noch die weitere Anwendung der CT als Messtechnik. Das momentan mit CT messbare Teilespektrum wird bei dickwandigen Bauteilen durch die fehlende Verfügbarkeit von Röntgendetektoren für hohe Energien (speziell Flächendetektoren) beschränkt. Im folgenden wird ein Forschungsprojekt zwischen 10 deutschen Industrieunternehmen und Instituten und zwei deutschen Bundesanstalten (Physikalisch-Technische Bundesanstalt (PTB) und Bundesanstalt für Materialforschung und -prüfung) vorgestellt, dass die Weiterentwicklung der CT als dimensionelle Messtechnik zur Aufgabe hat. Das Projekt hat eine Laufzeit von drei Jahren (Start 01.Okt. 2003). Es werden hier die Projektziele und erste Ergebnisse vorgestellt.
In this paper the characterisation of functionally graded materials is elucidated by several different methods. These methods described here are used for the quantitative analysis of materials with a local dependence of microstructure parameters. Using X-ray microscopy (computed tomography) for 3D-measurements and optical microscopy on polished sections for 1D and 2D measurements on the same sample, a ceramic filter consisting of sintered spherical particles, various mathematical evaluation methods are described and compared.