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- X-ray refraction (3)
- Bragg magnification (2)
- Coherent imaging (2)
- Computed tomography (2)
- Computertomographie (2)
- Dimensionelles Messen (2)
- Holotomography (2)
- Microtomography (2)
- Non-destructive evaluation (2)
- Scintillator (2)
Die sehr gute Reproduzierbarkeit von tomographischen Messungen zusammen mit den digital vorliegenden Ergebnissen ermöglicht die zerstörungsfreie dreidimensionale quantitative Analyse der untersuchten Bauteile und Proben mit Methoden der Bildverarbeitung. Vorwiegend für den Nachweis von Poren eingesetzt, lassen sich mit CT auch unterschiedliche Materialbestandteile analysieren, wobei die einzige Voraussetzung ein hinreichender Unterschied (es genügen wenige Prozent) in den Röntgenabsorptionseigenschaften der zu unterscheidenden Bestandteile ist.
Mit den in der Bundesanstalt für Materialforschung und -prüfung entwickelten Computertomographieanlagen kann der Anteil von Hohlräumen und Materialbestandteilen einer Probe bestimmt werden, wobei die Größe der nachzuweisenden Bestandteile sich über mehrere Größenordnungen erstreckt.
An ausgewählten Beispielen aus den Bereichen Keramik, Bodenproben und Fahr-bahnübergangssystemen aus Asphalt werden die quantitativen Ergebnisse dargestellt und die in der Bestandteilanalyse erreichbare Genauigkeit diskutiert.
In this paper the characterisation of functionally graded materials is elucidated by several different methods. These methods described here are used for the quantitative analysis of materials with a local dependence of microstructure parameters. Using X-ray microscopy (computed tomography) for 3D-measurements and optical microscopy on polished sections for 1D and 2D measurements on the same sample, a ceramic filter consisting of sintered spherical particles, various mathematical evaluation methods are described and compared.
Kurzfassung
Röntgen-Computertomographie (CT) ist eine industriell eingeführte Technik zur zerstörungsfreien Fehlererkennung. Seit einiger Zeit werden industrielle CT-Anlagen auch zur Geometriebestimmung, d.h. für dimensionelle Messungen eingesetzt. Bei diesen Messungen treten Messabweichungen auf, die wegen komplexer Einflussgrößen derzeit nur schlecht quantifiziert werden können. Die Größe der beobachteten Messabweichungen erschwert zum Teil noch die weitere Anwendung der CT als Messtechnik. Das momentan mit CT messbare Teilespektrum wird bei dickwandigen Bauteilen durch die fehlende Verfügbarkeit von Röntgendetektoren für hohe Energien (speziell Flächendetektoren) beschränkt. Im folgenden wird ein Forschungsprojekt zwischen 10 deutschen Industrieunternehmen und Instituten und zwei deutschen Bundesanstalten (Physikalisch-Technische Bundesanstalt (PTB) und Bundesanstalt für Materialforschung und -prüfung) vorgestellt, dass die Weiterentwicklung der CT als dimensionelle Messtechnik zur Aufgabe hat. Das Projekt hat eine Laufzeit von drei Jahren (Start 01.Okt. 2003). Es werden hier die Projektziele und erste Ergebnisse vorgestellt.
The high-resolution synchrotron-based imaging stations at the BAMline (BESSY) and TopoTomo (ANKA)
(2008)
The BAMline at the BESSY light source in Berlin and the TopoTomo beamline at the ANKA synchrotron facility in Karlsruhe (both Germany) operate in the hard X-ray regime (above 6 keV) with similiar photon flux density. For typical imaging applications, a double multilayer monochromator or a filtered white beam is used. In order to optimise the field of view and the resolution of the available indirect pixel detectors, different optical systems have been installed, adapted, respectively, to a large field of view (macroscope) and to high spatial resolution (microscope). They can be combined with different camera systems, ranging from 16-bit dynamic range slow-scan CCDs to fast CMOS cameras. The spatial resolution can be brought substantially beyond the micrometer limit by using a Bragg magnifier. The moderate flux of both beamlines compared to other 3rd generation light sources is compensated by a dedicated scintillator concept. For selected applications, X-ray beam collimation has proven to be a reliable approach to increase the available photon flux density. Absorption contrast, phase contrast, holotomography and refraction-enhanced imaging are used depending on the application. Additionally, at the TopoTomo beamline digital white beam synchrotron topography is performed, using the digital X-ray pixel detectors installed.
The use of high brilliance and partial coherent synchrotron light for radiography and computed tomography (CT) allows to image micro-structured, multi-component specimens with different contrast modes and resolutions up to submicrometer range. This is of high interest for materials research, life science and non-destructive evaluation applications. An imaging setup for microtomography and radiography installed at BESSY II (a third generation synchrotron light source located in Berlin, Germany) as part of its first hard X-ray beamline (BAMline) can now be used for absorption, refraction as well as phase contrast dedicated to inhouse research and applications by external users. Monochromatic synchrotron light between 6 keV and 80 keV is attained via a fully automated double multilayer monochromator. For imaging applications the synchrotron beam transmitted by the sample is converted with a scintillator into visible light. By use of microscope optics this luminescence image is then projected onto, e.g., a CCD chip. Several scintillating materials are used in order to optimise the performance of the detector system. Different optical systems are available for imaging ranging from a larger field of view and moderate resolutions (macroscope up to 14 mm x 14 mm field of view) to high resolution (microscope down to 0.35 μm pixel size), offering magnifications from 1.8× to 40×. Additionally asymmetric cut Bragg crystals in front of the scintillator can be used for a further magnification in one dimension by a factor of about 20. Slow and fast cameras are available, with up to 16 bit dynamic range. We show the suitability of the setup for numerous applications from materials research and life science.
By means of synchrotron X-ray computed tomography, model composites consisting of silica and styrenebutadiene rubber were studied with a very high spatial resolution. By our analysis technique we were able to determine the nano- and micro dispersion from the experimental results by our numerical analysis. These results are discussed with respect to crucial advantages of the generically 3-dimensional tomography technique as compared to 2-dimensional methods. Our quantitative analysis of the 3d images demonstrates that in the case of our model composites the filler dispersion is good, independent on the filler concentration. Our new 3-dimensional results evidence that considering only 2-d pictures may lead to ambiguities that can lead to wrong conclusions.
Carrying out dimensional measurements by CT means assessing coordinates in space. CT must therefore be treated as a coordinate measuring technique similar to optical or tactile Coordinate Measuring Machines (CMMs). The well-established standards and guidelines for the acceptance- and verificationtesting of CMMs require the use of calibrated reference standards to achieve measurement machine characteristics.
Hence, transferring these concepts from coordinate metrology to CT, a dedicated CT-specific reference standard was designed, manufactured and calibrated using a tactile CMM. For comparison purposes, a CAD model was created by reverse engineering using the calibration data. The calibrated model was fed into a virtual CT and the measurement process was simulated. The reference standard was measured by micro-CT.
By comparing the characteristics of the measurement output of CT and the output gained from simulation, the influences of measurement artefacts can be judged, for the first time, in analogy to existing Guidelines of coordinate metrology.