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In the present paper, friction and mechanical properties of AFM-Scan-Induced ripple structures on films of polystyrene and poly-n-(butyl methacrylate) are investigated. Force volume measurements allow a quantitative analysis of the elastic moduli with nanometer resolution, showing a contrast in mechanical response between bundles and troughs. Additionally, analysis of the lateral cantilever deflection shows a clear correlation between friction and the sample topography. Those results support the theory of crack propagation and the formation of voids as a mechanism responsible for the formation of ripples. This paper also shows the limits of the presented measuring methods for soft, compliant, and small structures.
Contact-resonance AFM (CR-AFM) has been used in recent years for the measurement of mechanical properties. Compared with other techniques, CR-AFM has a much shorter acquisition time, compensating the incomplete theoretical understanding of the underlying physical phenomena. In the present paper, we propose a procedure, which allows to determine the elastic modulus of the sample as a parameter of the fit of the CR frequency as a function of the load. It is concluded that CR measurements are not appropriate for polymer samples. Major drawbacks are the bad resolution for moduli lower than ca. 10 GPa and the lack of a comprehensive physical model.