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Eingeladener Vortrag
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The new standard ISO 176362:2013 'NDT of welds: Radiographic testing - Part 2: X- and gamma ray techniques with digital detectors' describes a complex procedure for film replacement by phosphor imaging plates and digital detector arrays. RT modeling software should consider these detector types, X-ray film, and the standard requirements for image quality. Practitioners expect the same visibility of image quality indicators (IQI) in the simulated radiographs as in the experimental exposures. The proposed benchmark test is based on the comparison of experimental radiographs taken at BAM with modeled ones of participants. The experimental setup and the determination of the equivalent penetrameter sensitivity (EPS) as described in the procedure of ASTM E 746 are used for quantitative evaluation of the achievable contrast sensitivity for step hole IQIs as considered in Annex B of ISO 17636-2. System classification data for Computed Radiography (CR) and film systems will be provided by BAM according to ISO 116991 for selected film systems and according to ASTM E 2446 for selected CR systems. The classification of films and digital detectors is based on the measurement of the dose response function, the basic spatial resolution (SRb) of the image, and the measured image noise, which depends on the detector efficiency, the quantum statistics, and the detector fixed pattern noise.
One essential step on the way towards accurate quantitative simulation of radiographic testing is an accurate description of the utilized energy spectrum of X-ray photons. For use in general purpose simulation tools, the spectra of X-ray tubes have to be described by a model covering at least the intended range of applications. This range includes transmission tubes as well as direct beam tubes with varying angles of incidence and emission, for a number of typical target materials. In radiographic testing acceleration voltages frequently reach up to 450 kV for direct beam targets and up to 225 kV for transmission targets, with even higher voltages available or being developed. Currently used models are unable to cover the whole range of configurations.
Here a model is presented that employs a unified approach for simulating the photon energy spectra for transmission and direct beam targets composed of arbi-trary homogeneous materials. In order to achieve this, a detailed model of electron transport within the target is employed. The validity of the developed model is shown through comparisons with Monte Carlo simulations as well as measurements for a number of different configurations.
A fast quantitative model for the energy spectra of radiation emitted by X-ray tubes is described, handling thin as well as thick plane targets of arbitrary materials. The developed model is based on fundamental interaction cross sections, describing electron and photon transport via numerical integration of discretized distributions. While the focus lies on bremsstrahlung production, modeling of characteristic radiation is fully integrated. The model does not include any free parameters. The validity of the model is shown through comparison with measurements and Monte Carlo simulations for several combinations of target material and acceleration potential between 30 kV and 450 kV.
Applications of RT Modelling
(2014)
Modelling becomes more and more important in modern NDE. It is increasingly used to optimize techniques for complex applications, to support the preparation of written procedures, and for education purposes. To describe the complete chain of RT, the model includes simulating all necessary properties of X- or Gamma-ray sources, the interaction of photons with material with special attention to scattered radiation, the detection process, and the complete geometrical RT setup handling arbitrary parts or constructions. Depending on the given inspection problem and the influencing factors that should be addressed by the simulation, an appropriate physical model has to be chosen to describe the underlying interaction mechanisms. The simulator aRTist combines analytical and Monte Carlo methods to efficiently model the radiation transport such that transmission as well as scatter techniques can be modelled. In this contribution we Focus on Monte Carlo Simulation of scatter contribution within aRTist. Examples for RT/tomographic applications and back-scatter techniques are presented to demonstrate the usability of the presented simulation tool for a broad range of radiological applications.
In this contribution, we present a dual high-energy X-ray imaging technique for cargo container inspection using the 'spectral high-energy X-ray attenuation method'. This method is based on attenuation of continuous highenergy spectra. The developed experimental technique consists of a betatron as high-energy (up to 7.5 MeV) X-ray source and a matrix detector with high spatial resolution (400 ìm) for digital X-ray imaging. In order to evaluate the material discrimination capability using dual high-energy X-ray imaging, a test specimen is proposed, comprising step wedges of different low and high atomic number (Z) materials. The selected X-ray spectra for the dual-energy experiments correspond to 3 MV and 7.5 MV acceleration potential of the betatron. We evaluated the ratio between low- and high-energy X-ray attenuation coefficients quantitatively based on simulated poly-energetic high-energy X-ray source spectra and the detector sensitivity using the 'analytical Radiographic Testing inspection simulation tool' (aRTist) developed at BAM. The simulated effective attenuation coefficients are compared with corresponding experimental results in order to establish a method for identification of low- and high-Z materials in the container. Finally, important applications of the proposed technique in the context of aviation security are discussed.
Correctly modeling the continuous photon spectrum of X-ray tubes requires detailed knowledge of the probability distribution of electron properties at the time of X-ray photon creation, in particular electron energy, depth within the target, and direction of movement. Semi-analytical X-ray spectrum models frequently assume a very simplified or even uniform distribution of electron direction. In the case of thick targets and small deviations from normal incidence this is a useful approximation. For thin targets or large deviations from normal incidence the correct distribution of electron directions becomes more important. As calculation speed is an important aspect of semi-analytical models compared to Monte Carlo simulations, fast evaluation of the distribution of electron properties is highly desirable. The approach presented here numerically evaluates the evolution of a discrete probability distribution of electron properties due to single electron scatter interactions within a plane target. This allows capturing the important aspects of the electron distribution while achieving runtimes of a few seconds up to a minute on a standard office PC.